Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2013Local structure of amorphous GaN1-xAsx semiconductor alloys across the composition range6citations
  • 2013Microstructure of Mg doped GaNAs alloys1citations
  • 2012Structural studies of GaN 1-x As x and GaN 1-x Bi x alloys for solar cell applications3citations
  • 2011GaNAs alloys over the whole composition range grown on crystalline and amorphous substrates9citations
  • 2010GaN1-xBix34citations
  • 2010Low gap amorphous GaN1-x Asx alloys grown on glass substrate19citations

Places of action

Chart of shared publication
Liliental-Weber, Z.
5 / 25 shared
Walukiewicz, W.
6 / 87 shared
Foxon, C. T.
6 / 36 shared
Wu, J.
5 / 56 shared
Dubon, O. D.
4 / 40 shared
Novikov, S. V.
6 / 22 shared
Reis, R. D.
1 / 1 shared
Reis, R. Dos
1 / 3 shared
Dubon, O.
1 / 1 shared
Luckert, F.
1 / 3 shared
Martin, R. W.
1 / 11 shared
Broesler, R.
2 / 8 shared
Tseng, A.
1 / 1 shared
Kao, V. M.
1 / 2 shared
Chart of publication period
2013
2012
2011
2010

Co-Authors (by relevance)

  • Liliental-Weber, Z.
  • Walukiewicz, W.
  • Foxon, C. T.
  • Wu, J.
  • Dubon, O. D.
  • Novikov, S. V.
  • Reis, R. D.
  • Reis, R. Dos
  • Dubon, O.
  • Luckert, F.
  • Martin, R. W.
  • Broesler, R.
  • Tseng, A.
  • Kao, V. M.
OrganizationsLocationPeople

article

Low gap amorphous GaN1-x Asx alloys grown on glass substrate

  • Levander, A. X.
  • Liliental-Weber, Z.
  • Walukiewicz, W.
  • Foxon, C. T.
  • Wu, J.
  • Dubon, O. D.
  • Kao, V. M.
  • Novikov, S. V.
  • Broesler, R.
Abstract

Amorphous GaN<sub>1-x</sub> As<sub>x</sub> layers with As content in the range of x=0.1 to 0.6 were grown by molecular beam epitaxy on Pyrex glass substrate. These alloys exhibit a wide range of band gap values from 2.2 to 1.3 eV. We found that the density of the amorphous films is ∼0.8-0.85 of their corresponding crystalline value. These amorphous films have smooth morphology, homogeneous composition, and sharp well defined optical absorption edges. The measured band gap values for the crystalline and amorphous GaN<sub>1-x</sub> As<sub>x</sub> alloys are in excellent agreement with the predictions of the band anticrossing model. The high absorption coefficient of ∼ 105cm-1 for the amorphous GaN<sub>1-x</sub> As<sub>x</sub> films suggests that relatively thin films (on the order of 1 μm) are necessary for photovoltaic application. © 2010 American Institute of Physics.

Topics
  • density
  • impedance spectroscopy
  • amorphous
  • thin film
  • glass
  • glass