Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2011Influence of gate dielectric on the ambipolar characteristics of solution-processed organic field-effect transistors13citations
  • 2004Epitaxial growth and physical properties of a room temperature ferromagnetic semiconductor: Anatase phase Ti1−xCoxO232citations

Places of action

Chart of shared publication
Takaishi, K.
1 / 1 shared
Muto, T.
1 / 1 shared
Ribierre, Jean Charles
1 / 5 shared
Ghosh, S.
1 / 67 shared
Tamura, K.
1 / 5 shared
Yamada, Y.
1 / 8 shared
Tsukazaki, A.
1 / 9 shared
Nakajima, K.
1 / 7 shared
Chikyow, T.
1 / 6 shared
Toyosaki, H.
1 / 1 shared
Fukumura, T.
1 / 9 shared
Segawa, Y.
1 / 5 shared
Hasegawa, T.
1 / 5 shared
Koinuma, H.
1 / 17 shared
Chart of publication period
2011
2004

Co-Authors (by relevance)

  • Takaishi, K.
  • Muto, T.
  • Ribierre, Jean Charles
  • Ghosh, S.
  • Tamura, K.
  • Yamada, Y.
  • Tsukazaki, A.
  • Nakajima, K.
  • Chikyow, T.
  • Toyosaki, H.
  • Fukumura, T.
  • Segawa, Y.
  • Hasegawa, T.
  • Koinuma, H.
OrganizationsLocationPeople

article

Epitaxial growth and physical properties of a room temperature ferromagnetic semiconductor: Anatase phase Ti1−xCoxO2

  • Tamura, K.
  • Yamada, Y.
  • Tsukazaki, A.
  • Nakajima, K.
  • Chikyow, T.
  • Toyosaki, H.
  • Fukumura, T.
  • Aoyama, T.
  • Segawa, Y.
  • Hasegawa, T.
  • Koinuma, H.
Abstract

<jats:p>There has been considerable debate regarding the origin of ferromagnetism in the ferromagnetic semiconductor anatase phase TiO2 doped with Co, ranging from carrier induced ferromagnetism in a framework of diluted magnetic semiconductor to merely the precipitation of ferromagnetic and metallic Co precipitates in the TiO2 matrix. This paper reports on a systematic investigation of the structures, together with the electronic and magneto-optical properties, of thin films of anatase phase TiO2, doped with Co. Films of anatase Ti1−xCoxO2 (x=0–0.10) were grown epitaxially on LaSrAlO4 (001) substrates, using pulsed laser deposition method. In order to control n-type carrier concentration, the oxygen pressure during the growth was systematically varied, yielding films with insulative, semiconductive (carrier concentration n∼1×1017 cm−3), and metallic (n∼2×1019 cm−3) properties. Reflection high energy electron diffraction patterns, atomic force microscopy, and transmission electron microscopy show no evidence of Co segregation in these films. Magneto-optical response was examined by measuring magneto-optical circular dichroism (MCD) spectra at room temperature. A large MCD peak appears at a photon energy close to the band gap of TiO2. The magnetic field dependence of MCD signal indicates ferromagnetic behavior, which is similar to that of the magnetization. The MCD intensity increases systematically with the increase of n or x. Since MCD response originates from charge carriers at the band edge, one can conclude that interaction between the charge carriers and Co impurities is essential to realize ferromagnetism.</jats:p>

Topics
  • impedance spectroscopy
  • phase
  • thin film
  • Oxygen
  • atomic force microscopy
  • semiconductor
  • transmission electron microscopy
  • precipitate
  • precipitation
  • pulsed laser deposition
  • magnetization
  • high energy electron diffraction