Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Sun, H. D.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2006Hybrid inorganic/organic micro-structured light-emitting diodes produced by self-aligned direct writingcitations
  • 2005Photoluminescence properties of dilute nitride InNAs/InGaAs/InP multi-quantum wells for mid-infrared applications1citations
  • 2004Effects of rapid thermal annealing on the optical properties of low-loss 1.3um GaInNAs/GaAs saturable bragg reflectors3citations
  • 2003Selective modification of band gap in GaInNAs/GaAs structures by quantum-well intermixing10citations
  • 2003Characterization of selective quantum well intermixing in 1.3um GaInNAs/GaAs structures20citations

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Chart of shared publication
Dawson, Md
5 / 39 shared
Belton, C.
1 / 2 shared
Zhang, H. X.
1 / 2 shared
Mackintosh, A. R.
1 / 7 shared
Kuhne, A.
1 / 2 shared
Gu, Erdan
1 / 14 shared
Bradley, D. D. C.
1 / 15 shared
Pethrick, R. A.
1 / 17 shared
Calvez, S.
2 / 9 shared
Clark, A. H.
1 / 1 shared
Shih, D. K.
1 / 1 shared
Lin, H. H.
1 / 2 shared
Valentine, G. J.
1 / 1 shared
Gundogdu, K.
1 / 1 shared
Hall, K. C.
1 / 1 shared
Burns, D.
1 / 3 shared
Macaluso, R.
3 / 5 shared
Pessa, M.
1 / 7 shared
Boggess, T. F.
1 / 1 shared
Jouhti, T.
1 / 2 shared
Robert, F.
2 / 6 shared
Marsh, J. H.
2 / 3 shared
Riechert, H.
2 / 11 shared
Bryce, A. C.
2 / 3 shared
Chart of publication period
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Co-Authors (by relevance)

  • Dawson, Md
  • Belton, C.
  • Zhang, H. X.
  • Mackintosh, A. R.
  • Kuhne, A.
  • Gu, Erdan
  • Bradley, D. D. C.
  • Pethrick, R. A.
  • Calvez, S.
  • Clark, A. H.
  • Shih, D. K.
  • Lin, H. H.
  • Valentine, G. J.
  • Gundogdu, K.
  • Hall, K. C.
  • Burns, D.
  • Macaluso, R.
  • Pessa, M.
  • Boggess, T. F.
  • Jouhti, T.
  • Robert, F.
  • Marsh, J. H.
  • Riechert, H.
  • Bryce, A. C.
OrganizationsLocationPeople

article

Characterization of selective quantum well intermixing in 1.3um GaInNAs/GaAs structures

  • Dawson, Md
  • Sun, H. D.
  • Robert, F.
  • Marsh, J. H.
  • Riechert, H.
  • Bryce, A. C.
  • Macaluso, R.
Abstract

Rapid thermal annealing combined with SiO2 caps deposited on the surface of samples by different techniques is used to selectively disorder 1.3 mum GaInNAs/GaAs multiquantum wells which have been preannealed in situ to the stage of blueshift saturation. After thermal annealing under specific conditions, a shift in band gap of over 170 meV has been obtained in sputtered SiO2-capped samples, while uncapped and plasma enhanced chemical vapor deposited SiO2-capped samples demonstrated a negligible shift. Quantum well intermixing in sputtered SiO2-capped samples originates from enhanced compositional interdiffusion due to the generation of point defects by ion bombardment during the sputtering process. Secondary ion mass spectrometry has confirmed that the enhanced blueshift was caused by the interdiffusion of group III atoms (In and Ga) between the quantum wells and barriers. Detailed photoluminescence and excitation spectroscopy were performed to study the optical properties of both intermixed and nonintermixed samples.

Topics
  • impedance spectroscopy
  • surface
  • photoluminescence
  • annealing
  • spectrometry
  • secondary ion mass spectrometry
  • interdiffusion
  • point defect