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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Bäuerle, Dieter
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (11/11 displayed)
- 2010Modification and nano-patterning of high-Tc superconducting thin films by masked ion beam irradiationcitations
- 2009Masked ion beam irradiation of high-temperature superconductors: patterning of nano-size regions with high point-defect densitycitations
- 2006Ion-beam modification of high-temperature superconductor thin films for the fabrication of superconductive nanodevices
- 2006Non-exponential optical modification of the electrical properties in oxygen-deficient YBa2Cu3Ox
- 2006Angle dependence of the Hall effect in HgBa2 CaCu2 O6 thin filmscitations
- 2006Ion-beam direct-structuring of high-temperature superconductorscitations
- 2006Angle-dependence of the Hall effect in Hg-Ba-Ca-Cu-O thin films
- 2004Tailoring the transport properties of YBa2Cu3O7-δ thin films by light-ion irradiation
- 2002Electrical properties, texture, and microstructure of vicinal YBa2Cu3O7-δ thin filmscitations
- 2001Pulsed-laser deposition and characterization of high-temperature superconducting films
- 2000Double sign reversal of the vortex Hall effect in YBa2Cu3O7-δ thin films in the strong pinning limit of low magnetic fieldscitations
Places of action
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article
Electrical properties, texture, and microstructure of vicinal YBa2Cu3O7-δ thin films
Abstract
Vicinal YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-δ</sub> (YBCO) thin films of thickness <em>h</em> = 20 – 480 nm are grown by pulsed-laser deposition on 10° miscut (001) SrTiO<sub>3</sub> substrates. The anisotropic resistivities, <em>c</em>-axis texture, and critical temperature drastically depend on the thickness of vicinal films. High-resolution electron microscopy reveals a defect microstructure with strong bending of the YBCO lattice near the SrTiO<sub>3</sub>interface and improved film microstructure at larger distances to the substrate. The required layer thickness for microstructure relaxation and increase of electrical conductivity are significantly larger than the critical thickness of <em>c</em>-axis oriented YBCO films.