• Riveiro, J. M.
• Arranz, M. A.
• Torre, M. A. López De La
• González, J. A.
• Andrés, J. P.

Abstract

<jats:p>The interdiffusion process between Gd and Co has been investigated in several series of multilayered films consisting of Co and different GdCo alloys (Gd1−xCox)/Co (x=0, 0.37, and 0.60). Grazing incidence x-ray profiles provided a preliminary insight into the structure of the samples. Electrical resistivity measurements were performed in a temperature range between 8 and 300 K. For the three series, the room temperature electrical resistivity shows a clear fall once a critical Co thickness is surpassed, which we interpret as due to the growth of pure polycrystalline Co between the alloy layers. A simple model allows us to quantify the amount of Co diffused into the alloy layer. The results will be discussed considering the possible decrease of interdiffusion effects when Co is deposited onto the more stable GdCo alloys. This leads to a well defined multilayered structure, something that is essential for practical applications and for the theoretical study of its underlying physics.</jats:p>

Topics

• impedance spectroscopy
• resistivity
• interdiffusion