Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2001High-temperature goniometer for thin film growth and ion scattering studies11citations

Places of action

Chart of shared publication
Lippmaa, M.
1 / 6 shared
Furumochi, T.
1 / 1 shared
Nagasawa, H.
1 / 1 shared
Ishida, T.
1 / 3 shared
Satoh, T.
1 / 1 shared
Koinuma, H.
1 / 17 shared
Chart of publication period
2001

Co-Authors (by relevance)

  • Lippmaa, M.
  • Furumochi, T.
  • Nagasawa, H.
  • Ishida, T.
  • Satoh, T.
  • Koinuma, H.
OrganizationsLocationPeople

article

High-temperature goniometer for thin film growth and ion scattering studies

  • Lippmaa, M.
  • Ohashi, S.
  • Furumochi, T.
  • Nagasawa, H.
  • Ishida, T.
  • Satoh, T.
  • Koinuma, H.
Abstract

<jats:p>We have developed a laser-heated six-axis goniometer for oxide thin film growth and ion scattering studies. The goniometer requires only a single CF152 flange for mounting in a vacuum chamber and includes three positioning and three rotational degrees of freedom. All translation and rotation axes are decoupled. A sample with a maximum size of 10 mm×10 mm can be heated to 1200 °C in a pure oxygen environment. The heating source is a 300 W continuous wave Nd:YAG laser. Light from the laser is brought to the sample stage with a combination of flexible and rigid optical fibers. The goniometer includes a motorized manipulator for two ablation targets, making it possible to grow thin films by pulsed laser ablation. Film growth and surface structure can be monitored by reflection high-energy electron diffraction and coaxial impact collision ion scattering spectroscopy. Samples can also be transferred from the goniometer to a room-temperature scanning tunneling microscope inside the vacuum chamber.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • thin film
  • Oxygen
  • electron diffraction
  • ion scattering
  • laser ablation