Materials Map

Discover the materials research landscape. Find experts, partners, networks.

  • About
  • Privacy Policy
  • Legal Notice
  • Contact

The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

×

Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

←

Page 1 of 27758

→
←

Page 1 of 0

→
PeopleLocationsStatistics
Naji, M.
  • 2
  • 13
  • 3
  • 2025
Motta, Antonella
  • 8
  • 52
  • 159
  • 2025
Aletan, Dirar
  • 1
  • 1
  • 0
  • 2025
Mohamed, Tarek
  • 1
  • 7
  • 2
  • 2025
Ertürk, Emre
  • 2
  • 3
  • 0
  • 2025
Taccardi, Nicola
  • 9
  • 81
  • 75
  • 2025
Kononenko, Denys
  • 1
  • 8
  • 2
  • 2025
Petrov, R. H.Madrid
  • 46
  • 125
  • 1k
  • 2025
Alshaaer, MazenBrussels
  • 17
  • 31
  • 172
  • 2025
Bih, L.
  • 15
  • 44
  • 145
  • 2025
Casati, R.
  • 31
  • 86
  • 661
  • 2025
Muller, Hermance
  • 1
  • 11
  • 0
  • 2025
Kočí, JanPrague
  • 28
  • 34
  • 209
  • 2025
Šuljagić, Marija
  • 10
  • 33
  • 43
  • 2025
Kalteremidou, Kalliopi-ArtemiBrussels
  • 14
  • 22
  • 158
  • 2025
Azam, Siraj
  • 1
  • 3
  • 2
  • 2025
Ospanova, Alyiya
  • 1
  • 6
  • 0
  • 2025
Blanpain, Bart
  • 568
  • 653
  • 13k
  • 2025
Ali, M. A.
  • 7
  • 75
  • 187
  • 2025
Popa, V.
  • 5
  • 12
  • 45
  • 2025
Rančić, M.
  • 2
  • 13
  • 0
  • 2025
Ollier, Nadège
  • 28
  • 75
  • 239
  • 2025
Azevedo, Nuno Monteiro
  • 4
  • 8
  • 25
  • 2025
Landes, Michael
  • 1
  • 9
  • 2
  • 2025
Rignanese, Gian-Marco
  • 15
  • 98
  • 805
  • 2025

Müller, T. A. R.

  • Google
  • 1
  • 7
  • 44

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2000Epitaxial growth of ferromagnetic Ni2MnGa on GaAs(001) using NiGa interlayers44citations

Places of action

Chart of shared publication
Dong, J. W.
1 / 3 shared
Carr, D. M.
1 / 1 shared
Mckernan, S.
1 / 3 shared
Pan, Q.
1 / 4 shared
Chen, L. C.
1 / 3 shared
Palmstrøm, C. J.
1 / 10 shared
Xie, J. Q.
1 / 4 shared
Chart of publication period
2000

Co-Authors (by relevance)

  • Dong, J. W.
  • Carr, D. M.
  • Mckernan, S.
  • Pan, Q.
  • Chen, L. C.
  • Palmstrøm, C. J.
  • Xie, J. Q.
OrganizationsLocationPeople

article

Epitaxial growth of ferromagnetic Ni2MnGa on GaAs(001) using NiGa interlayers

  • Dong, J. W.
  • Carr, D. M.
  • Müller, T. A. R.
  • Mckernan, S.
  • Pan, Q.
  • Chen, L. C.
  • Palmstrøm, C. J.
  • Xie, J. Q.
Abstract

<p>Heusler alloy Ni<sub>2</sub>MnGa thin films have been grown pseudomorphically on a relaxed NiGa interlayer on GaAs(001) by molecular-beam epitaxy. In situ reflection high-energy electron diffraction patterns, ex situ x-ray diffraction, and cross-sectional view transmission electron microscopy electron diffraction patterns confirm the single-crystal growth of Ni<sub>2</sub>MnGa. The films grow pseudomorphically on the relaxed NiGa interlayer with a tetragonal structure (a=b=5.79 Å and c=6.07 Å). Magnetic measurements using vibrating sample and superconducting quantum interference device magnetometers reveal Ni<sub>2</sub>MnGa to have an in-plane easy axis and a Curie temperature ∼350 K.</p>

Topics
  • x-ray diffraction
  • thin film
  • electron diffraction
  • transmission electron microscopy
  • Curie temperature