Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2024Wetting Properties of Black Silicon Layers Fabricated by Different Techniques3citations
  • 2023Properties of Black Silicon Layers Fabricated by Different Techniques for Solar Cell Applications8citations
  • 2018Optimization of surface reflectance for silicon solar cells18citations

Places of action

Chart of shared publication
Liu, Xiaolong
2 / 13 shared
Savin, Hele
1 / 75 shared
Vardanyan, Arman
1 / 1 shared
Hakhoyan, Levon
2 / 2 shared
Ayvazyan, Karen
1 / 1 shared
Chart of publication period
2024
2023
2018

Co-Authors (by relevance)

  • Liu, Xiaolong
  • Savin, Hele
  • Vardanyan, Arman
  • Hakhoyan, Levon
  • Ayvazyan, Karen
OrganizationsLocationPeople

article

Optimization of surface reflectance for silicon solar cells

  • Ayvazyan, Gagik
Abstract

<jats:p>A study on the formation of black silicon (b-Si) antireflection layers on crystalline Si wafers using SF<jats:sub>6</jats:sub>/O<jats:sub>2</jats:sub>gas mixture in a reactive ion etching method is presented. The process is low-temperature, fast and does not depend on the crystallographic orientation of the Si wafer. The b-Si layers have demonstrated average reflectance values of 4% and 5% for monoand polycrystalline Si wafers respectively, feature that is suitable for the fabrication of high efficiency solar cells. Passivation of b-Si antireflection layers by suitable different thin films can significantly reduce needle-like surface recombination losses.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • thin film
  • Silicon
  • plasma etching