Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2022Investigating the dielectric properties and exciton diffusion in C70 derivatives5citations
  • 2022An Inkjet-Printed Piezoresistive Bidirectional Flow Sensor2citations
  • 2022Investigating the dielectric properties and exciton diffusion in C 70 derivatives5citations

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Chart of shared publication
Pshenichnikov, Maxim S.
2 / 5 shared
Kooij, Felien S. Van
1 / 2 shared
Kuevda, Alexey V.
2 / 2 shared
Rousseva, Sylvia
2 / 7 shared
Raul, Benedito A. L.
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Hummelen, Jan
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Sengupta, Debarun
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Kottapalli, Ajay Giri Prakash
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Wortche, Heinrich J.
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Chiechi, Ryan C.
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Van Kooij, Felien S.
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Hummelen, Jan C.
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2022

Co-Authors (by relevance)

  • Pshenichnikov, Maxim S.
  • Kooij, Felien S. Van
  • Kuevda, Alexey V.
  • Rousseva, Sylvia
  • Raul, Benedito A. L.
  • Hummelen, Jan
  • Sengupta, Debarun
  • Kottapalli, Ajay Giri Prakash
  • Wortche, Heinrich J.
  • Chiechi, Ryan C.
  • Van Kooij, Felien S.
  • Hummelen, Jan C.
OrganizationsLocationPeople

article

Investigating the dielectric properties and exciton diffusion in C70 derivatives

  • Pshenichnikov, Maxim S.
  • Kooij, Felien S. Van
  • Birudula, Srikanth
  • Kuevda, Alexey V.
  • Rousseva, Sylvia
  • Raul, Benedito A. L.
  • Hummelen, Jan
Abstract

<p>In recent years, the dielectric constant (<i>ε</i><sub>r</sub>) of organic semiconductors (OSCs) has been of interest in the organic photovoltaic (OPV) community due to its potential influence on the exciton binding energy. Despite progress in the design of high <i>ε</i><sub>r</sub> OSCs and the accurate measurement of the <i>ε</i><sub>r</sub>, the effects of the synthetic strategies on specific (opto)electronic properties of the OSCs remain uncertain. In this contribution, the effects of εr on the optical properties of five new C<sub>70</sub> derivatives and [70]PCBM are investigated. Together with [70]PCBM, the derivatives have a range of <i>ε</i><sub>r</sub> values that depend on the polarity and length of the side chains. The properties of the singlet excitons are investigated in detail with steady-state and time-resolved spectroscopy and the exciton diffusion length is measured. All six derivatives show similar photophysical properties in the neat films. However, large differences in the crystallinity of the fullerene films influence the exciton dynamics in blend films. This work shows that design principles for OSCs with a higher <i>ε</i><sub>r</sub> can have a very different influence on the performance of traditional BHJ devices and in neat films and it is important to consider the neat film properties when investigating the optoelectronic properties of new materials for OPV.</p>

Topics
  • impedance spectroscopy
  • dielectric constant
  • semiconductor
  • crystallinity