Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2016Enhancement of optical and mechanical properties of Si nanopillars by ALD TiO<inf>2</inf>coating30citations
  • 2015Tailoring the structural, optical, and photoluminescence properties of porous silicon/TiO<inf>2</inf> nanostructures54citations
  • 2015Structural and XPS characterization of ALD Al<inf>2</inf>O<inf>3</inf> coated porous silicon272citations
  • 2010Molecular dynamics in grafted polydimethylsiloxanes9citations

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Chart of shared publication
Iatsunskyi, Igor
3 / 59 shared
Załęski, Karol
3 / 41 shared
Jurga, Stefan
4 / 59 shared
Pavlenko, M.
1 / 1 shared
Smyntyna, V.
1 / 1 shared
Romero, Luis Emerson Coy
1 / 35 shared
Smyntyna, Valentyn
2 / 7 shared
Ramanavicius, Arunas
1 / 10 shared
Baleviciute, Ieva
1 / 2 shared
Nowaczyk, Grzegorz
2 / 20 shared
Pavlenko, Mykola
1 / 8 shared
Viter, Roman
1 / 15 shared
Kempiński, Mateusz
1 / 11 shared
Wypych, A.
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Maciejewski, Hieronim
1 / 4 shared
Makrocka-Rydzyk, Monika
1 / 3 shared
Fojud, Zbigniew
1 / 7 shared
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2016
2015
2010

Co-Authors (by relevance)

  • Iatsunskyi, Igor
  • Załęski, Karol
  • Jurga, Stefan
  • Pavlenko, M.
  • Smyntyna, V.
  • Romero, Luis Emerson Coy
  • Smyntyna, Valentyn
  • Ramanavicius, Arunas
  • Baleviciute, Ieva
  • Nowaczyk, Grzegorz
  • Pavlenko, Mykola
  • Viter, Roman
  • Kempiński, Mateusz
  • Wypych, A.
  • Maciejewski, Hieronim
  • Makrocka-Rydzyk, Monika
  • Fojud, Zbigniew
OrganizationsLocationPeople

article

Enhancement of optical and mechanical properties of Si nanopillars by ALD TiO<inf>2</inf>coating

  • Iatsunskyi, Igor
  • Załęski, Karol
  • Jurga, Stefan
  • Pavlenko, M.
  • Jancelewicz, Mariusz Andrzej
  • Smyntyna, V.
  • Romero, Luis Emerson Coy
Abstract

<p>The mechanical and optical properties of Si and TiO<sub>2</sub>-Si nanopillars (NPl) were investigated. Mesoporous silicon NPl arrays were fabricated by metal-assisted chemical etching and nanosphere lithography, and then pillars were covered by TiO<sub>2</sub> using the atomic layer deposition technique. We performed scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), energy dispersive X-ray spectroscopy (EDX), Raman spectroscopy, reflectance, photoluminescence (PL) spectroscopy and nanoindentation to characterize the as-prepared and annealed TiO<sub>2</sub>-Si NPl. The main structural and mechanical parameters of TiO<sub>2</sub>-Si NPl (grain size, strain, critical load, elastic recovery and Young's module) were calculated. Reflectance and PL spectroscopy were used to study the impact of morphology on optical properties of TiO<sub>2</sub>-Si NPl before and after annealing. It was established that the nanostructures of TiO<sub>2</sub> penetrated inside the porous matrix of Si pillar improve the mechanical properties of TiO<sub>2</sub>-Si NPl. The results of nanoindentation study have shown that Young's modulus of annealed TiO<sub>2</sub>-Si NPl is about three times higher than for the pure Si NPl.</p>

Topics
  • porous
  • impedance spectroscopy
  • photoluminescence
  • grain
  • grain size
  • scanning electron microscopy
  • x-ray diffraction
  • nanoindentation
  • transmission electron microscopy
  • Silicon
  • etching
  • annealing
  • Energy-dispersive X-ray spectroscopy
  • Raman spectroscopy
  • lithography
  • atomic layer deposition