| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Waser, Rainer
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (29/29 displayed)
- 2024Variability-aware modeling of electrochemical metallization memory cells
- 2024Space charge governs the kinetics of metal exsolutioncitations
- 2023Enhanced metal exsolution at the non-polar (001) surfaces of multi-faceted epitaxial thin filmscitations
- 2021Carbonate formation lowers the electrocatalytic activity of perovskite oxides for water electrolysiscitations
- 2020Control of stoichiometry and morphology in polycrystalline V2O3 thin films using oxygen bufferscitations
- 2020Defect chemistry of donor-doped BaTiO 3 with BaO-excess for reduction resistant PTCR thermistor applications – redox-behaviourcitations
- 2020Competition between V2O3 phases deposited by one-step reactive sputtering process on polycrystalline conducting electrodecitations
- 2019Topotactic Phase Transition Driving Memristive Behaviorcitations
- 2019Electrochemical metallization ReRAMs (ECM) - Experiments and modellingcitations
- 2019Electrolysis of Water at Atomically Tailored Epitaxial Cobaltite Surfacescitations
- 2018A Theoretical and Experimental View on the Temperature Dependence of the Electronic Conduction through a Schottky Barrier in a Resistively Switching SrTiO3-Based Memory Cellcitations
- 2018Addressing Multiple Resistive States of Polyoxovanadatescitations
- 2018Reduction of the forming voltage through tailored oxygen non-stoichiometry in tantalum oxide ReRAM devicescitations
- 2017Electrochemical Tantalum Oxide for Resistive Switching Memoriescitations
- 2017Spectroscopic indications of tunnel barrier charging as the switching mechanism in memristive devicescitations
- 2015Formation and Movement of Cationic Defects During Forming and Resistive Switching in $mathrm{SrTiO_3}$ Thin Film Devicescitations
- 2015Impedance spectroscopy study of the unipolar and bipolar resistive switching states of atomic layer deposited polycrystalline ZrO2 thin filmscitations
- 2015The influence of the local oxygen vacancy concentration on the piezoresponse of strontium titanate thin filmscitations
- 2015Resistive Switching of Individual, Chemically Synthesized TiO $_{2}$ Nanoparticlescitations
- 2014Fast mapping of inhomogeneities in the popular metallic perovskite Nb:SrTiO 3 by confocal Raman microscopycitations
- 2014Physical origins and suppression of Ag dissolution in $mathrm{GeS_x}$-based ECM cellscitations
- 2014Atomic Layer Deposition of TiO x /Al 2 O 3 Bilayer Structures for Resistive Switching Memory Applicationscitations
- 2013Growth and crystallization of TiO 2 thin films by atomic layer deposition using a novel amido guanidinate titanium source and tetrakis-dimethylamido-titanium
- 2013Dysprosium-doped (Ba, Sr) TiO3 thin films on nickel foilsfor capacitor applicationscitations
- 2013Feasibility studies for filament detection in resistively switching SrTiO3 devices by employing grazing incidence small angle X-ray scatteringcitations
- 2012Electrochemical metallization cells—blending nanoionics into nanoelectronics?citations
- 2011Spark plasma sintering of nanocrystalline BaTiO3-powders: consolidation behavior and dielectric characteristicscitations
- 2005High-k dielectric materials by metalorganic chemical vapor deposition : Growth and characterization
- 2001Thickness dependent morphology and electrical characteristics of SrBi 2Ta2O9 deposited by metal organic decompositioncitations
Places of action
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article
The influence of the local oxygen vacancy concentration on the piezoresponse of strontium titanate thin films
Abstract
n this study, the influence of the local oxygen vacancy concentration on piezoresponse force microscopy (PFM) measurements was investigated. Ultra-thin single-crystalline SrTiO3 thin films were deposited on niobium doped SrTiO3 substrates and analyzed using a combined PFM and local conductive atomic force microscopy (LC-AFM) measurement setup. After applying different polarization voltages between ±2 V and ±5 V to the thin films, we simultaneously observed an anomalous contrast in the piezoresponse amplitude and phase signal as well as a changed local conductivity in the exact same region. Since classic ferroelectricity can be excluded as the reason for the observed contrast, an influence of the local oxygen vacancy concentration on the piezoresponse is considered. Additionally, the surface potential was measured using Kelvin probe force microscopy (KPFM) revealing a change in surface potential in the regions of the applied voltage. The observed relaxation of the surface potential over time was fitted to a local oxidation reaction of the previously reduced regions of the ultra-thin SrTiO3 film. We propose a model that relates the local oxygen vacancy concentration to the surface potential. The influence of the oxygen vacancy concentration on the PFM measurements is explained.