Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2008Soft X-ray spectroscopy study of electronic structure in the organic semiconductor titanyl phthalocyanine (TiO-Pc)22citations
  • 2006Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering4citations
  • 2003Surface degradation of InxGa1-xN thin films by sputter-anneal processing4citations

Places of action

Chart of shared publication
Smith, Kevin E.
3 / 10 shared
Wang, Shancai
2 / 2 shared
Demasi, Alex
1 / 2 shared
Zhang, Yufeng
2 / 4 shared
Reid, Ian
1 / 4 shared
Piper, L. F. J.
1 / 7 shared
Mcguinness, Cormac
1 / 7 shared
Bernardis, Sarah
1 / 2 shared
Learmonth, Timothy
1 / 3 shared
Odonnell, Cian
1 / 1 shared
Glans, Per Anders
1 / 1 shared
Plucinski, Lukasz
1 / 5 shared
Moustakas, Theodore D.
1 / 3 shared
Lindau, Ingolf
1 / 2 shared
Iliopoulos, Eleftherios
1 / 1 shared
Chart of publication period
2008
2006
2003

Co-Authors (by relevance)

  • Smith, Kevin E.
  • Wang, Shancai
  • Demasi, Alex
  • Zhang, Yufeng
  • Reid, Ian
  • Piper, L. F. J.
  • Mcguinness, Cormac
  • Bernardis, Sarah
  • Learmonth, Timothy
  • Odonnell, Cian
  • Glans, Per Anders
  • Plucinski, Lukasz
  • Moustakas, Theodore D.
  • Lindau, Ingolf
  • Iliopoulos, Eleftherios
OrganizationsLocationPeople

article

Soft X-ray spectroscopy study of electronic structure in the organic semiconductor titanyl phthalocyanine (TiO-Pc)

  • Smith, Kevin E.
  • Wang, Shancai
  • Matsuura, A. Y.
  • Demasi, Alex
  • Zhang, Yufeng
  • Reid, Ian
  • Piper, L. F. J.
Abstract

<p>The electronic structure of the organic semiconductor titanyl phthalocyanine (TiO-Pc) has been investigated using synchrotron radiation-excited X-ray emission and absorption spectroscopies. The C and N K-edge spectra display similarities with those recorded from other metal-Pcs, while the O K-edge and Ti L-edge spectra support the premise that the titanyl species are spatially isolated. Good agreement is found between a calculation of the partial density of states and the measured spectra, although the Ti L-edge spectra differ from a previous study. Two energy loss features are reported from resonant X-ray inelastic scattering at the Ti L-edge associated with O 2p-Ti 3d* and N 2p-Ti 3d* charge transfer transitions.</p>

Topics
  • density
  • impedance spectroscopy
  • semiconductor
  • X-ray spectroscopy