Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2019A Pixelated Microwave Near-Field Sensor for Precise Characterization of Dielectric Materials72citations

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Soleimani, Mohammad
1 / 4 shared
Saadat-Safa, Maryam
1 / 1 shared
Ramahi, Omar M.
1 / 1 shared
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2019

Co-Authors (by relevance)

  • Soleimani, Mohammad
  • Saadat-Safa, Maryam
  • Ramahi, Omar M.
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article

A Pixelated Microwave Near-Field Sensor for Precise Characterization of Dielectric Materials

  • Soleimani, Mohammad
  • Nayyeri, Vahid
  • Saadat-Safa, Maryam
  • Ramahi, Omar M.
Abstract

<jats:title>Abstract</jats:title><jats:p>A highly sensitive microwave near-field sensor based on electrically-small planar resonators is proposed for highly accurate characterization of dielectric materials. The proposed sensor was developed in a robust complete-cycle topology optimization procedure wherein first the sensing area was pixelated. By maximizing the sensitivity as our goal, a binary particle swarm optimization algorithm was applied to determine whether each pixel is metalized or not. The outcome of the optimization is a pixelated pattern of the resonator yielding the maximum possible sensitivity. A curve fitting method was applied to the full-wave simulation results to derive a closed form expression for extracting the dielectric constant of a chemical material from the shift in the resonance frequency of the sensor. As a proof of concept, the sensor was fabricated and used to measure the permittivity of two known liquids (cyclohexane and chloroform) and their mixtures with different volume ratios. The experimentally extracted dielectric constants were in an excellent agreement with the reference data (for pure cyclohexane and chloroform) or those obtained by mixture formulas.</jats:p>

Topics
  • impedance spectroscopy
  • simulation
  • dielectric constant