Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2020Substrate induced nanoscale resistance variation in epitaxial graphene29citations

Places of action

Chart of shared publication
Traeger, Georg A.
1 / 2 shared
Pierz, Klaus
1 / 4 shared
Tegenkamp, Christoph
1 / 25 shared
Schumacher, Hans Werner
1 / 3 shared
Willke, Philip
1 / 3 shared
Seyller, Thomas
1 / 18 shared
Sinterhauf, Anna
1 / 2 shared
Speck, Florian
1 / 6 shared
Schädlich, Philip
1 / 5 shared
Wenderoth, Martin
1 / 3 shared
Chart of publication period
2020

Co-Authors (by relevance)

  • Traeger, Georg A.
  • Pierz, Klaus
  • Tegenkamp, Christoph
  • Schumacher, Hans Werner
  • Willke, Philip
  • Seyller, Thomas
  • Sinterhauf, Anna
  • Speck, Florian
  • Schädlich, Philip
  • Wenderoth, Martin
OrganizationsLocationPeople

document

Substrate induced nanoscale resistance variation in epitaxial graphene

  • Traeger, Georg A.
  • Pierz, Klaus
  • Tegenkamp, Christoph
  • Schumacher, Hans Werner
  • Willke, Philip
  • Seyller, Thomas
  • Sinterhauf, Anna
  • Speck, Florian
  • Pakdehi, Davood Momeni
  • Schädlich, Philip
  • Wenderoth, Martin
Abstract

Graphene, the first true two-dimensional material, still reveals the most remarkable transport properties among the growing class of two-dimensional materials. Although many studies have investigated fundamental scattering processes, the surprisingly large variation in the experimentally determined resistances is still an open issue. Here, we quantitatively investigate local transport properties of graphene prepared by polymer assisted sublimation growth using scanning tunneling potentiometry. These samples exhibit a spatially homogeneous current density, which allows to analyze variations in the local electrochemical potential with high precision. We utilize this possibility by examining the local sheet resistance finding a significant variation of up to 270% at low temperatures. We identify a correlation of the sheet resistance with the stacking sequence of the 6H silicon carbide substrate and with the distance between the graphene and the substrate. Our results experimentally quantify the impact of the graphene-substrate interaction on the local transport properties of graphene.

Topics
  • density
  • impedance spectroscopy
  • polymer
  • carbide
  • Silicon
  • defect
  • two-dimensional
  • current density
  • potentiometry