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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Dionne, Jennifer A.
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Publications (7/7 displayed)
- 2024Highly confined epsilon-near-zero- and surface-phonon polaritons in SrTiO3 membranes
- 2022Lattice-Resolution, Dynamic Imaging of Hydrogen Absorption into Bimetallic AgPd Nanoparticles.citations
- 2021Dynamic lattice distortions driven by surface trapping in semiconductor nanocrystals.citations
- 2016Reconstructing solute-induced phase transformations within individual nanocrystalscitations
- 2015Probing Complex Reflection Coefficients in One-Dimensional Surface Plasmon Polariton Waveguides and Cavities Using STEM EELS.citations
- 2013Observation of Quantum Tunneling between Two Plasmonic Nanoparticlescitations
- 2012Quantum plasmon resonances of individual metallic nanoparticlescitations
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article
Probing Complex Reflection Coefficients in One-Dimensional Surface Plasmon Polariton Waveguides and Cavities Using STEM EELS.
Abstract
The resonant properties of a plasmonic cavity are determined by the size of the cavity, the surface plasmon polariton (SPP) dispersion relationship, and the complex reflection coefficients of the cavity boundaries. In small wavelength-scale cavities, the phase propagation due to reflections from the cavity walls is of a similar magnitude to propagation due to traversing the cavity. Until now, this reflection phase has been inferred from measurements of the resonant frequencies of a cavity of known dispersion and length. In this work, we present a method for measuring the complex reflection coefficients of a truncation in a 1D surface plasmon waveguide using electron energy loss spectroscopy in the scanning transmission electron microscope (STEM EELS) and show that this insight can be used to engineer custom cavities with engineered reflecting boundaries, whose resonant wavelengths and internal mode density profiles can be analytically predicted given knowledge of the cavity dimensions and complex reflection coefficients of the boundaries.