Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2008Nanoporous organosilicate films prepared in acidic conditions using tetraalkylammonium bromide porogens9citations
  • 2007Characterization of a molecular sieve coating using ellipsometric porosimetry43citations
  • 2004Sealing of porous low-k dielectrics24citations

Places of action

Chart of shared publication
Eslava, Salvador
2 / 23 shared
Kirschhock, C. E. A.
2 / 2 shared
Martens, J. A.
2 / 4 shared
Urrutia, J.
1 / 1 shared
Baklanov, M. R.
2 / 8 shared
Aldea, S.
1 / 1 shared
Iacopi, F.
1 / 13 shared
Whelan, C. M.
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Rudolf, Petra
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Le, Q. T.
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Cecchet, F.
1 / 1 shared
Pireaux, J. J.
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Satta, A.
1 / 2 shared
Chart of publication period
2008
2007
2004

Co-Authors (by relevance)

  • Eslava, Salvador
  • Kirschhock, C. E. A.
  • Martens, J. A.
  • Urrutia, J.
  • Baklanov, M. R.
  • Aldea, S.
  • Iacopi, F.
  • Whelan, C. M.
  • Rudolf, Petra
  • Le, Q. T.
  • Cecchet, F.
  • Pireaux, J. J.
  • Satta, A.
OrganizationsLocationPeople

article

Characterization of a molecular sieve coating using ellipsometric porosimetry

  • Aldea, S.
  • Maex, K.
  • Eslava, Salvador
  • Kirschhock, C. E. A.
  • Martens, J. A.
  • Iacopi, F.
  • Baklanov, M. R.
Abstract

Ellipsometric porosimetry was used to determine the adsorption isotherms of toluene, methanol, and water on b-oriented Silicalite-1 coatings with a thickness of less than ca. 250 nm and to obtain adsorption kinetics. The adsorption isotherms are of sufficient quality to reveal several aspects of the pore structure such as the adsorbate capacity and the adsorbate/framework affinity. The use of a combination of different molecular probes in ellipsometric porosimetry to elucidate the molecular accessibility of Silicalite-1 pores is demonstrated. It is shown that ellipsometric porosimetry is an appropriate technique for probing the influence of aging of the Silicalite-1 coating and of planarization polishing on the porosity, pore accessibility, and adsorbate/framework affinity.

Topics
  • impedance spectroscopy
  • pore
  • laser emission spectroscopy
  • aging
  • porosity
  • aging
  • polishing
  • porosimetry