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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Jonas, Am
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (13/13 displayed)
- 2015Field-effect memory transistors based on arrays of nanowires of a ferroelectric polymer
- 2014The Ferro- to Paraelectric Curie Transition of a Strongly Confined Ferroelectric Polymercitations
- 2012Optimization of the structural parameters of new potentiometric pH and urea sensors based on polyaniline and a polysaccharide coupling layercitations
- 2011Melting and van der Waals Stabilization of PE Single Crystals Grown from Ultrathin Filmscitations
- 2010pH and Enzymatic Sensors Based on Nanostructured Conductive Polymer Films
- 2010Bidimensional Response Maps of Adaptive Thermo- and pH-Responsive Polymer Brushescitations
- 2006First insights into electrografted polymers by AFM-based force spectroscopycitations
- 2005A theoretical and experimental study of atomic-layer-deposited films onto porous dielectric substrates
- 2005Partial dewetting of polyethylene thin films on rough silicon dioxide surfaces.citations
- 2003Image analysis of transmission electron micrographs of semicrystalline polymers: a comparison with X-ray scattering resultscitations
- 2003Spinodal-like dewetting of thermodynamically-stable thin polymer films.citations
- 2001Characterization of the molecular structure of two highly isotactic polypropylenescitations
- 2000PEEK oligomers as physical model compounds for the polymer. 4. Lamellar microstructure and chain dynamics.citations
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article
Partial dewetting of polyethylene thin films on rough silicon dioxide surfaces.
Abstract
The effect of roughness on the dewetting behavior of polyethylene thin films on silicon dioxide substrates is presented. Smooth and rough silicon dioxide substrates of 0.3 and 3.2-3.9 nm root-mean-square roughness were prepared by thermal oxidation of silicon wafers and plasma-enhanced chemical vapor deposition on silicon wafers, respectively. Polymer thin films of approximately 80 nm thickness were deposited by spin-coating on these substrates. Subsequent dewetting and crystallization of the polyethylene were observed by hot-stage optical microscopy in reflection mode. During heating, the polymer films melt and dewet on both substrates. Further observations after cooling indicate that, whereas complete dewetting occurs on the smooth substrate surface, partial dewetting occurs for the polymer film on the rough surface. The average thickness of the residual film on the rough surface was determined by ellipsometry to be a few nanometers, and the spatial distribution of the polymer in the cavities of the rough surface could be obtained by X-ray reflectometry. The residual film originates from the impregnation of the porous surface by the polymer fluid, leading to the observed partial dewetting behavior. This new type of partial dewetting should have important practical consequences, as most real surfaces exhibit significant roughness.