Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Friedrich Schiller University Jena

in Cooperation with on an Cooperation-Score of 37%

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Publications (5/5 displayed)

  • 2020Continuous-wave laser annealing of metallic layers for CuInSe2 solar cell applications: effect of preheating treatment on grain growth3citations
  • 2018Quantitative sensory testing after macroreplantation: evidence for a specific somatosensory profile3citations
  • 2016Effectiveness of temporary deafferentation of the arm on somatosensory and motor functions following stroke: a systematic review4citations
  • 2010Connectivity Analysis of Somatosensory Evoked Potentials in Patients with Major Depression13citations
  • 2005In Situ Investigations on Organic Foam Films Using Neutron and Synchrotron Radiation31citations

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Scarpulla, Michael A.
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Giraldo, Sergio
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Saucedo, Edgardo
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Dale, Phillip
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Friedel, Reinhard
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Franz, Marcel
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Opsommer, Emmanuelle
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Ionov, J.
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Miltner, W. H. R.
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Bär, K.-J.
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Leistritz, L.
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Witte, H.
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Boué, François
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Renault, Anne
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Delannay, Renaud
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Artzner, Franck
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Etrillard, Janine
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Cantat, Isabelle
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Axelos, Monique A. V.
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Co-Authors (by relevance)

  • Scarpulla, Michael A.
  • Giraldo, Sergio
  • Saucedo, Edgardo
  • Arnou, Panagiota
  • Dale, Phillip
  • Lomuscio, Alberto
  • Miltner, Wolfgang H. R.
  • Hofmann, Gunther O.
  • Racz, Juliane
  • Blume, Kathrin R.
  • Friedel, Reinhard
  • Puta, Christian
  • Dietrich, Caroline
  • Franz, Marcel
  • Opsommer, Emmanuelle
  • Korogod, Natalya
  • Zwissig, Camille
  • Ionov, J.
  • Miltner, W. H. R.
  • Bär, K.-J.
  • Leistritz, L.
  • Witte, H.
  • Boué, François
  • Renault, Anne
  • Delannay, Renaud
  • Artzner, Franck
  • Etrillard, Janine
  • Cantat, Isabelle
  • Axelos, Monique A. V.
OrganizationsLocationPeople

article

In Situ Investigations on Organic Foam Films Using Neutron and Synchrotron Radiation

  • Boué, François
  • Weiss, Thomas
  • Renault, Anne
  • Delannay, Renaud
  • Artzner, Franck
  • Etrillard, Janine
  • Cantat, Isabelle
  • Axelos, Monique A. V.
Abstract

We report on small-angle neutron scattering (SANS) and X-ray scattering (SAXS) investigations of foam films stabilized by sodium dodecyl sulfate. Previous measurements on dry foams (Axelos, M. A. V.; Boué, B. Langmuir 2003, 19, 6598) have shown the presence of spikes in the two-dimensional scattering data which suggest that the incident beam is reflected on some film surfaces. The latter interpretation is confirmed by new neutron studies performed on ordered (“bamboo”) foams which allow selection of single films. In the first case, we show that the spikes of the scattered intensity can be obtained by reflection on two parts of the foam, namely, the films and the Plateau borders. With synchrotron radiation, first observations of distinct interference fringes have allowed an accurate determination of the film thickness. A comparison with X-ray and neutron data is made, opening a general discussion about the capabilities of small-angle scattering techniques for studying the microscopic properties of foam films.

Topics
  • impedance spectroscopy
  • surface
  • Sodium
  • two-dimensional
  • small-angle neutron scattering
  • small angle x-ray scattering