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Morini, Pierangelo
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article
Time-resolved simultaneous detection of structural and chemical changes during self-assembly of mesostructured films
Abstract
<p>In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.</p>