| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Hübner, René
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (25/25 displayed)
- 2023Room-temperature extended short-wave infrared GeSn photodetectors realized by ion beam techniquescitations
- 2023Structural investigations of Au–Ni aerogels: morphology and element distributioncitations
- 2023Bottom-up fabrication of FeSb2 nanowires on crystalline GaAs substrates with ion-induced pre-patterning
- 2022Defect Nanostructure and its Impact on Magnetism of α-Cr2O3 thin filmscitations
- 2022Flexomagnetism and vertically graded Néel temperature of antiferromagnetic Cr2O3 thin films
- 2022Homogenization and short-range chemical ordering of Co–Pt alloys driven by the grain boundary migration mechanismcitations
- 2022Band-gap and strain engineering in GeSn alloys using post-growth pulsed laser melting
- 2022Self-Supported Three-Dimensional Quantum Dot Aerogels as a Promising Photocatalyst for CO2 Reduction
- 2021Controlled Silicidation of Silicon Nanowires Using Flash Lamp Annealingcitations
- 2020Increasing the Diversity and Understanding of Semiconductor Nanoplatelets by Colloidal Atomic Layer Deposition
- 2020Formation of Thin NiGe Films by Magnetron Sputtering and Flash Lamp Annealingcitations
- 2020Directionality of metal-induced crystallization and layer exchange in amorphous carbon/nickel thin film stackscitations
- 2020Tunable magnetic vortex dynamics in ion-implanted permalloy diskscitations
- 2019Specific ion effects directed noble metal aerogels: Versatile manipulation for electrocatalysis and beyondcitations
- 2019Structure-property relationship of Co 2 MnSi thin films in response to He + -irradiation
- 2018Percolated Si:SiO2 Nanocomposites: Oven- vs. Millisecond Laser-Induced Crystallization of SiOx Thin Filmscitations
- 2018Nematicity of correlated systems driven by anisotropic chemical phase separationcitations
- 2018Core–Shell Structuring of Pure Metallic Aerogels towards Highly Efficient Platinum Utilization for the Oxygen Reduction Reactioncitations
- 2017Interplay between localization and magnetism in (Ga,Mn)As and (In,Mn)As
- 2017Purely antiferromagnetic magnetoelectric random access memory
- 2016Bonding structure and morphology of chromium oxide films grown by pulsed-DC reactive magnetron sputter depositioncitations
- 2016Carbon : nickel nanocomposite templates - predefined stable catalysts for diameter-controlled growth of single-walled carbon nanotubescitations
- 2013Forming-free resistive switching in multiferroic BiFeO3 thin films with enhanced nanoscale shuntscitations
- 2005Focussing and defocussing effects at radio frequency glow discharge optical emission spectroscopy analyses of thin films with partly nonconductive componentscitations
- 2002Crystallisation of caesium borosilicate glasses with approximate boroleucite compositioncitations
Places of action
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article
Forming-free resistive switching in multiferroic BiFeO3 thin films with enhanced nanoscale shunts
Abstract
<p>A controlled shunting of polycrystalline oxide thin films on the nanometer length scale opens the door to significantly modify their transport properties. In this paper, the low energy Ar<sup>+</sup> irradiation induced shunting effect of forming-free, non-volatile resistive switching in polycrystalline BiFeO <sub>3</sub> thin film capacitor-like structures with macroscopic bottom and top contacts was investigated. Oxygen atoms at the BiFeO<sub>3</sub> surface are preferentially sputtered by Ar<sup>+</sup> ion irradiation and oxygen vacancies and a metallic Bi phase are formed at the surface of the BiFeO<sub>3</sub> thin film before deposition of the top contacts. A phenomenological model is that of nanoscale shunt resistors formed in parallel to the actual BiFeO<sub>3</sub> thin film capacitor-like structure. This model fits the noticeable increase of the retention stability and current density after irradiation. The formation of stable and conductive shunts is further evidenced by conductive atomic force microscopy measurements.</p>