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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Ali, M. A. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Schmid, Silvan
TU Wien
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (9/9 displayed)
- 2019Thin Film Analysis by Nanomechanical Infrared Spectroscopycitations
- 2016Nonlinear optomechanical measurement of mechanical motioncitations
- 2014Single-layer graphene on silicon nitride micromembrane resonatorscitations
- 2014Single-layer graphene on silicon nitride micromembrane resonatorscitations
- 2014Micromechanical String Resonators: Analytical Tool for Thermal Characterization of Polymerscitations
- 2013Optical detection of radio waves through a nanomechanical transducer
- 2011Biodegradable micromechanical sensors
- 2011Fabrication and characterization of SRN/SU-8 bimorph cantilevers for temperature sensingcitations
- 2011Superparamagnetic photocurable nanocomposite for the fabrication of microcantileverscitations
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article
Thin Film Analysis by Nanomechanical Infrared Spectroscopy
Abstract
There is a fundamental need for techniques for thin film characterization. The current options for obtaining infrared (IR) spectra typically suffer from low signal-to-noise-ratios (SNRs) for sample thicknesses confined to a few nanometers. We present nanomechanical infrared spectroscopy (NAM-IR), which enables the measurement of a complete infrared fingerprint of a polyvinylpyrrolidone (PVP) layer as thin as 20 nm with an SNR of 307. Based on the characterization of the given NAM-IR setup, a minimum film thickness of only 160 pm of PVP can be analyzed with an SNR of 2. Compared to a conventional attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR) system, NAM-IR yields an SNR that is 43 times larger for a 20 nm-thick PVP layer and requires only a fraction of the acquisition time. These results pave the way for NAM-IR as a highly sensitive, fast, and practical tool for IR analysis of polymer thin films.