Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

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Show results for 693.932 people that are selected by your search filters.

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University of Manchester

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (7/7 displayed)

  • 2024Electron Beam and Thermal Stabilities of MFM-300(M) Metal-Organic Frameworks2citations
  • 2020Atomic Resolution Imaging of CrBr 3 using Adhesion-Enhanced Grids17citations
  • 2020Atomic Resolution Imaging of CrBr3 using Adhesion-Enhanced Grids17citations
  • 2019Formation and healing of defects in atomically thin GaSe and InSe48citations
  • 2019Formation and healing of defects in atomically thin GaSe and InSe48citations
  • 2018Infrared-to-violet tunable optical activity in atomic films of GaSe, InSe, and their heterostructures65citations
  • 2018Nanometer Resolution Elemental Mapping in Graphene-based TEM Liquid Cells124citations

Places of action

Chart of shared publication
Haigh, Sj
5 / 63 shared
Tien, Eu Pin
1 / 3 shared
Tang, Chiu
1 / 7 shared
Yang, Sihai
1 / 32 shared
Chen, Yinlin
1 / 4 shared
Schroder, Martin
1 / 23 shared
Carter, Joseph
1 / 2 shared
Tillotson, Evan
1 / 1 shared
Cao, Guanhai
1 / 1 shared
Thompson, Stephen
1 / 9 shared
Allen, Christopher
1 / 4 shared
Ngo, Duc-The
1 / 7 shared
Zou, Yichao
2 / 6 shared
Hopkinson, David G.
4 / 5 shared
Wang, Wendong
2 / 3 shared
Gorbachev, Roman V.
5 / 11 shared
Haigh, Sarah J.
2 / 15 shared
Bointon, Thomas H.
2 / 2 shared
Hamer, Matthew J.
5 / 7 shared
Kelly, Daniel J.
2 / 3 shared
Zhou, Mingwei
3 / 3 shared
Allen, Cs
1 / 4 shared
Terry, Dj
1 / 1 shared
Kudrynskyi, Zakhar
2 / 6 shared
Andreev, Yury
1 / 1 shared
Kirkland, Angus I.
2 / 5 shared
Rooney, Ap
1 / 3 shared
Falko, Vladimir I.
2 / 26 shared
Kovalyuk, Zakhar
2 / 2 shared
Patanè, Amalia
1 / 6 shared
Hopkinson, Dg
1 / 2 shared
Lewis, Dj
1 / 30 shared
Zólyomi, Viktor
2 / 6 shared
Patan, Amalia
1 / 5 shared
Fal Ko, Vladimir I.
1 / 1 shared
Allen, Christopher S.
1 / 1 shared
Gorbachev, Roman
1 / 5 shared
Andreev, Yuri
1 / 1 shared
Rooney, Aidan P.
1 / 4 shared
Terry, Daniel J.
2 / 2 shared
Hamer, Matthew
1 / 4 shared
Zlyomi, Viktor
1 / 2 shared
Lewis, David J.
1 / 6 shared
Rakowski, Alexander M.
1 / 3 shared
Magorrian, Samuel J.
1 / 1 shared
Andreev, Yuri M.
1 / 1 shared
Tyurnina, Anastasia V.
1 / 4 shared
Novoselov, Kostya S.
1 / 26 shared
Kazakova, Olga
1 / 9 shared
Kelly, Daniel
1 / 5 shared
Rakowski, Alexander
1 / 6 shared
Lewis, Edward
1 / 4 shared
Chart of publication period
2024
2020
2019
2018

Co-Authors (by relevance)

  • Haigh, Sj
  • Tien, Eu Pin
  • Tang, Chiu
  • Yang, Sihai
  • Chen, Yinlin
  • Schroder, Martin
  • Carter, Joseph
  • Tillotson, Evan
  • Cao, Guanhai
  • Thompson, Stephen
  • Allen, Christopher
  • Ngo, Duc-The
  • Zou, Yichao
  • Hopkinson, David G.
  • Wang, Wendong
  • Gorbachev, Roman V.
  • Haigh, Sarah J.
  • Bointon, Thomas H.
  • Hamer, Matthew J.
  • Kelly, Daniel J.
  • Zhou, Mingwei
  • Allen, Cs
  • Terry, Dj
  • Kudrynskyi, Zakhar
  • Andreev, Yury
  • Kirkland, Angus I.
  • Rooney, Ap
  • Falko, Vladimir I.
  • Kovalyuk, Zakhar
  • Patanè, Amalia
  • Hopkinson, Dg
  • Lewis, Dj
  • Zólyomi, Viktor
  • Patan, Amalia
  • Fal Ko, Vladimir I.
  • Allen, Christopher S.
  • Gorbachev, Roman
  • Andreev, Yuri
  • Rooney, Aidan P.
  • Terry, Daniel J.
  • Hamer, Matthew
  • Zlyomi, Viktor
  • Lewis, David J.
  • Rakowski, Alexander M.
  • Magorrian, Samuel J.
  • Andreev, Yuri M.
  • Tyurnina, Anastasia V.
  • Novoselov, Kostya S.
  • Kazakova, Olga
  • Kelly, Daniel
  • Rakowski, Alexander
  • Lewis, Edward
OrganizationsLocationPeople

article

Formation and healing of defects in atomically thin GaSe and InSe

  • Haigh, Sj
  • Allen, Cs
  • Terry, Dj
  • Kudrynskyi, Zakhar
  • Andreev, Yury
  • Gorbachev, Roman V.
  • Kirkland, Angus I.
  • Rooney, Ap
  • Falko, Vladimir I.
  • Kovalyuk, Zakhar
  • Patanè, Amalia
  • Hopkinson, Dg
  • Hamer, Matthew J.
  • Lewis, Dj
  • Zólyomi, Viktor
  • Clark, Nick
Abstract

Two dimensional III–VI metal monochalcogenide materials, such as GaSe and InSe, are attracting considerable attention due to their promising electronic and optoelectronic properties. Here, an investigation of point and extended atomic defects formed in mono-, bi-, and few-layer GaSe and InSe crystals is presented. Using state-of-the-art scanning transmission electron microscopy, it is observed that these materials can form both metal and selenium vacancies under the action of the electron beam. Selenium vacancies are observed to be healable: recovering the perfect lattice structure in the presence of selenium or enabling incorporation of dopant atoms in the presence of impurities. Under prolonged imaging, multiple point defects are observed to coalesce to form extended defect structures, with GaSe generally developing trigonal defects and InSe primarily forming line defects. These insights into atomic behavior could be harnessed to synthesize and tune the properties of 2D post-transition-metal monochalcogenide materials for optoelectronic applications.

Topics
  • impedance spectroscopy
  • semiconductor
  • transmission electron microscopy
  • forming
  • defect structure
  • point defect