Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2021In-plane quasi-single-domain BaTiO<sub>3</sub> via interfacial symmetry engineering35citations
  • 2018Continuously Tuning Epitaxial Strains by Thermal Mismatch51citations
  • 2015A labile hydride strategy for the synthesis of heavily nitridized BaTiO<sub>3</sub>127citations
  • 2014Inversion Symmetry Breaking by Oxygen Octahedral Rotations in the Ruddlesden-Popper NaRTiO<sub>4</sub> Family71citations
  • 2013Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO<sub>3</sub> thin films on DyScO<sub>3</sub> substrates39citations

Places of action

Chart of shared publication
Eom, Chang-Beom
1 / 6 shared
Eom, K.
1 / 1 shared
Gopalan, V.
1 / 14 shared
Yuan, Y.
1 / 9 shared
Huyan, H. X.
1 / 1 shared
Lee, H.
1 / 16 shared
Kim, T. H.
1 / 7 shared
Paudel, T. R.
1 / 2 shared
Wang, B.
1 / 21 shared
Lindemann, S.
1 / 1 shared
Pan, X. Q.
1 / 10 shared
Tsymbal, E. Y.
1 / 5 shared
Lee, J. W.
1 / 2 shared
Lu, H.
1 / 15 shared
Gruverman, A.
1 / 15 shared
Tybell, T.
1 / 3 shared
Zorn, J. A.
1 / 1 shared
Ryu, S.
1 / 4 shared
Chen, L. Q.
1 / 4 shared
Gao, W. P.
1 / 1 shared
Gopalan, Venkatraman
4 / 20 shared
Lapano, Jason
1 / 3 shared
Brahlek, Matthew
1 / 4 shared
Kabius, Bernd
1 / 4 shared
Yuan, Yakun
1 / 1 shared
Zhang, Lei
1 / 14 shared
Engel-Herbert, Roman
1 / 3 shared
Yajima, Takeshi
1 / 3 shared
Brown, Craig M.
1 / 4 shared
Yamamoto, Takafumi
1 / 2 shared
Tanaka, Katsuhisa
2 / 6 shared
Kageyama, Hiroshi
1 / 9 shared
Aidzu, Kohei
1 / 1 shared
Akamatsu, Hirofumi
2 / 2 shared
Takeiri, Fumitaka
1 / 1 shared
Ohkura, Masatoshi
1 / 1 shared
Green, Mark A.
1 / 5 shared
Yoshimune, Wataru
1 / 2 shared
Kobayashi, Yoji
1 / 3 shared
Fujita, Koji
2 / 9 shared
Rondinelli, James M.
1 / 9 shared
Stone, Greg
1 / 1 shared
Chen, Long-Qing
1 / 6 shared
Tanaka, Isao
1 / 5 shared
Kuge, Toshihiro
1 / 1 shared
Sen Gupta, Arnab
1 / 1 shared
Xue, Fei
1 / 4 shared
Togo, Atsushi
1 / 2 shared
Bernhagen, Margitta
1 / 1 shared
Haislmaier, Ryan
1 / 1 shared
Skoromets, Volodymyr
1 / 1 shared
Xi, Xiaoxing
1 / 7 shared
Schlom, Darrell G.
1 / 10 shared
Lee, Che-Hui
1 / 1 shared
Kužel, Petr
1 / 4 shared
Uecker, Reinhard
1 / 8 shared
Kamba, Stanislav
1 / 3 shared
Biegalski, Michael D.
1 / 4 shared
Martí, Xavier
1 / 1 shared
Chart of publication period
2021
2018
2015
2014
2013

Co-Authors (by relevance)

  • Eom, Chang-Beom
  • Eom, K.
  • Gopalan, V.
  • Yuan, Y.
  • Huyan, H. X.
  • Lee, H.
  • Kim, T. H.
  • Paudel, T. R.
  • Wang, B.
  • Lindemann, S.
  • Pan, X. Q.
  • Tsymbal, E. Y.
  • Lee, J. W.
  • Lu, H.
  • Gruverman, A.
  • Tybell, T.
  • Zorn, J. A.
  • Ryu, S.
  • Chen, L. Q.
  • Gao, W. P.
  • Gopalan, Venkatraman
  • Lapano, Jason
  • Brahlek, Matthew
  • Kabius, Bernd
  • Yuan, Yakun
  • Zhang, Lei
  • Engel-Herbert, Roman
  • Yajima, Takeshi
  • Brown, Craig M.
  • Yamamoto, Takafumi
  • Tanaka, Katsuhisa
  • Kageyama, Hiroshi
  • Aidzu, Kohei
  • Akamatsu, Hirofumi
  • Takeiri, Fumitaka
  • Ohkura, Masatoshi
  • Green, Mark A.
  • Yoshimune, Wataru
  • Kobayashi, Yoji
  • Fujita, Koji
  • Rondinelli, James M.
  • Stone, Greg
  • Chen, Long-Qing
  • Tanaka, Isao
  • Kuge, Toshihiro
  • Sen Gupta, Arnab
  • Xue, Fei
  • Togo, Atsushi
  • Bernhagen, Margitta
  • Haislmaier, Ryan
  • Skoromets, Volodymyr
  • Xi, Xiaoxing
  • Schlom, Darrell G.
  • Lee, Che-Hui
  • Kužel, Petr
  • Uecker, Reinhard
  • Kamba, Stanislav
  • Biegalski, Michael D.
  • Martí, Xavier
OrganizationsLocationPeople

article

Continuously Tuning Epitaxial Strains by Thermal Mismatch

  • Gopalan, Venkatraman
  • Lapano, Jason
  • Brahlek, Matthew
  • Kabius, Bernd
  • Yuan, Yakun
  • Zhang, Lei
  • Lei, Shiming
  • Engel-Herbert, Roman
Abstract

Strain engineering of thin films is a conventionally employed approach to enhance material properties and to energetically prefer ground states that would otherwise not be attainable. Controlling strain states in perovskite oxide thin films is usually accomplished through coherent epitaxy by using lattice-mismatched substrates with similar crystal structures. However, the limited choice of suitable oxide substrates makes certain strain states experimentally inaccessible and a continuous tuning impossible. Here, we report a strategy to continuously tune epitaxial strains in perovskite films grown on Si(001) by utilizing the large difference of thermal expansion coefficients between the film and the substrate. By establishing an adsorption-controlled growth window for SrTiO<sub>3</sub> thin films on Si using hybrid molecular beam epitaxy, the magnitude of strain can be solely attributed to thermal expansion mismatch, which only depends on the difference between growth and room temperature. Second-harmonic generation measurements revealed that structure properties of SrTiO<sub>3</sub> films could be tuned by this method using films with different strain states. Our work provides a strategy to generate continuous strain states in oxide/semiconductor pseudomorphic buffer structures that could help achieve desired material functionalities.

Topics
  • perovskite
  • impedance spectroscopy
  • thin film
  • semiconductor
  • thermal expansion