• Noh, Jun Hong
• Lim, Sean
• Kim, Dohyung
• Yun, Jae Sung
• Seidel, Jan
• Ovchinnikova, Olga S.
• Liu, Yongtao
• Borodinov, Nikolay
• Lee, Seungmin
• Ievlev, Anton V.
• Lim, Jihoo
• Choi, Eunyoung
• Ahmadi, Mahshid
• Soufiani, Arman Mahboubi

Abstract

<p>In the article, we found errors in the information provided in two of the experimental sections. We regret that the subsection "Photoluminescence (PL) Measurements"under the Characterizations section is completely incorrect and that we did not notice this during the internal review process nor at the proof stage. It is important to note that this correction does not affect the results in the original published paper, and the measurements were performed using the setup for which the details are provided in this Correction. The corrected detailed information is as follows. Time-Evolved Steady-State Photoluminescence (PL) Measurements. The PL measurements were performed using an in-house micro-PL microscope. Temperature control was enabled using a cryostat (Linkam, LTS420) for measurements at room temperature. The film side was placed onto the stage to ensure an adequate thermal contact. Optical excitation was achieved using an LED (Thorlabs, SOLIS-525C), with a center wavelength of 525 nm in the epi-illumination configuration. A short-pass 525 nm filter was placed in the excitation path to remove the low-energy tail emission of the LED. This was focused on the sample using a 0.6 NA, 50 magnification refractive lens, resulting in an incident light intensity of approximately 38 mW/cm2 and 600 μm diameter spot size. The PL emission was passed through a 550 nm long-pass filter to remove reflected optical excitation, followed by coupling into a 500 μm diameter, 0.22 NA multimode optical fiber. An Ocean Optics spectrometer (HR2000+) with a linear silicon charge-coupled device array was used to detect the PL emission relayed from the optical fiber. The integration time and a number of averages per spectra were chosen to maximize the signal-to-noise ratio while also ensuring changes in the PL signal with time were captured. Additionally, the information associated with the laser used for wavelength-dependent CPD measurements in the SPM subsection of the Characterizations section is missing. The information is as follows. In order to perform the wavelength-dependent CPD measurements, an external wavelength-tunable illumination source (FemtoPower 1060 laser) with an intensity of 200 mW/cm2 was used. </p>

Topics

• perovskite
• impedance spectroscopy
• photoluminescence
• phase
• positron annihilation lifetime spectroscopy
• Photoacoustic spectroscopy
• Silicon
• scanning probe microscopy