Materials Map

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2021Three-Dimensional Fine Structure of Nanometer-Scale Nafion Thin Films14citations

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Laurila, Tomi
1 / 96 shared
Etula, J.
1 / 2 shared
Engelhardt, P.
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Seitsonen, J.
1 / 1 shared
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2021

Co-Authors (by relevance)

  • Laurila, Tomi
  • Etula, J.
  • Engelhardt, P.
  • Seitsonen, J.
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article

Three-Dimensional Fine Structure of Nanometer-Scale Nafion Thin Films

  • Laurila, Tomi
  • Peltonen, A.
  • Etula, J.
  • Engelhardt, P.
  • Seitsonen, J.
Abstract

<p>Nafion is a widely used polymer membrane in various applications ranging from advanced energy solutions to sensing of biomolecules. Despite the intensive research carried out over the years to reveal and understand the fine structure of Nafion, its structural features, especially as nanometer-scale films, are not unambiguously known. In this paper, we use room temperature scanning transmission electron microscopy (STEM) tomography complemented by glancing incidence small-angle X-ray scattering (GISAXS) and TEM at low temperatures to reveal the fine structure of thin (10-100 nm) unannealed Nafion films. The results from the detailed three-dimensional reconstructions obtained show that (i) the phase fractions of the hydrophobic and hydrophilic parts of the polymer are somewhat thickness-dependent, changing from 0.65/0.35 to about 0.7/0.3 when moving from 100 to 10 nm thick films; (ii) the channel diameters show a range of values from 3 to 6 nm in all the films independent of their thickness; (iii) the average distances between the hydrophilic channels inside the film have distributions centered around 12 nm (in 10 nm films), 15 nm (in 30 nm films), and 7 nm (in 100 nm films); (iv) in the thickest films, the hydrophilic channels exhibit higher interconnectivity and some of the channels appear to end within the Nafion film instead of going through the films; and (v) there are some confinement effects caused by the hydrophilic SiO2 surface in the case of 10 and 30 nm thick films shown by the tendency of the hydrophilic channels to move horizontally near the substrate. Furthermore, a stable room temperature STEM tomography imaging method for Nafion films and a sample preparation method that preserves the characteristics of the hydrated morphology of Nafion in the dry state are demonstrated. These results provide a deeper understanding of the fine structure of Nafion thin films and provide a better means to characterize and understand their properties in different applications. </p>

Topics
  • impedance spectroscopy
  • surface
  • polymer
  • phase
  • thin film
  • tomography
  • transmission electron microscopy
  • X-ray scattering