Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2020Characterization of Nanomaterials by Locally Determining Their Complex Permittivity with Scattering-Type Scanning Near-Field Optical Microscopy25citations

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Chart of shared publication
Tranca, Denis E.
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Ishii, Satoshi
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Stanciu, George A.
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Stanciu, Stefan G.
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Bussetti, Gianlorenzo
1 / 8 shared
Yoo, Young Jin
1 / 2 shared
Yang, Fang
1 / 3 shared
Pastorino, Laura
1 / 3 shared
Hristu, Radu
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Chart of publication period
2020

Co-Authors (by relevance)

  • Tranca, Denis E.
  • Ishii, Satoshi
  • Stanciu, George A.
  • Stanciu, Stefan G.
  • Bussetti, Gianlorenzo
  • Yoo, Young Jin
  • Yang, Fang
  • Pastorino, Laura
  • Hristu, Radu
OrganizationsLocationPeople

article

Characterization of Nanomaterials by Locally Determining Their Complex Permittivity with Scattering-Type Scanning Near-Field Optical Microscopy

  • Tranca, Denis E.
  • Ishii, Satoshi
  • Boi, Stefania
  • Stanciu, George A.
  • Stanciu, Stefan G.
  • Bussetti, Gianlorenzo
  • Yoo, Young Jin
  • Yang, Fang
  • Pastorino, Laura
  • Hristu, Radu
Abstract

Scattering-type scanning near-field optical microscopy (s-SNOM) is currently regarded as a powerful tool for exploring important optical properties at nanoscale resolutions depending only on the size of a sharp tip that is scanned across the sample surface while being excited with a focused laser beam. Recently, it was shown that, among others, s-SNOM can quantitatively map the complex permittivity of materials and biological samples and hence other intrinsic related optical properties, such as the refractive index. In this work we apply this capability, previously demonstrated only at proof-of-concept level, in an experiment dealing with three distinct types of nanostructured materials: microcapsules for drug delivery assembled with layer-by-layer strategies, ultrathin optical coatings with controllable color properties, and plasmonic ceramic nanoparticles. We show that complex permittivity mapping with s-SNOM can contribute to the better understanding of such materials, providing information that is difficult or even impossible to assess with other techniques.

Topics
  • nanoparticle
  • impedance spectroscopy
  • surface
  • experiment
  • ceramic
  • optical microscopy