Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Eindhoven University of Technology

in Cooperation with on an Cooperation-Score of 37%

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Publications (1/1 displayed)

  • 2024Low Surface Recombination in Hexagonal SiGe Alloy Nanowires5citations

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Bakkers, Erik
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Haverkort, Jos
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Co-Authors (by relevance)

  • Bakkers, Erik
  • Haverkort, Jos
  • Theeuwes, Roel
  • Berghuis, W. J. H.
  • Farina, Riccardo
  • Macco, Bart
  • Peeters, W. H. J.
  • Renirie, Elsa
  • Fadaly, Elham
  • Van Lange, Victor Theodoor
  • Kessels, W. M. M.
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article

Low Surface Recombination in Hexagonal SiGe Alloy Nanowires

  • Bakkers, Erik
  • Haverkort, Jos
  • Theeuwes, Roel
  • Berghuis, W. J. H.
  • Farina, Riccardo
  • Macco, Bart
  • Peeters, W. H. J.
  • Renirie, Elsa
  • Fadaly, Elham
  • Van Lange, Victor Theodoor
  • Kessels, W. M. M.
  • Van Tilburg, Marvin
Abstract

Monolithic integration of silicon-based electronics and photonics could open the door toward many opportunities including on-chip optical data communication and large-scale application of light-based sensing devices in healthcare and automotive; by some, it is considered the Holy Grail of silicon photonics. The monolithic integration is, however, severely hampered by the inability of Si to efficiently emit light. Recently, important progress has been made by the demonstration of efficient light emission from direct-bandgap hexagonal SiGe (hex-SiGe) alloy nanowires. For this promising material, realized by employing a nanowire structure, many challenges and open questions remain before a large-scale application can be realized. Considering that for other direct-bandgap materials like GaAs, surface recombination can be a true bottleneck, one of the open questions is the importance of surface recombination for the photoluminescence efficiency of this new material. In this work, temperature-dependent photoluminescence measurements were performed on both hex-Ge and hex-SiGe nanowires with and without surface passivation schemes that have been well documented and proven effective on cubic silicon and germanium to elucidate whether and to what extent the internal quantum efficiency (IQE) of the wires can be improved. Additionally, time-resolved photoluminescence (TRPL) measurements were performed on unpassivated hex-SiGe nanowires as a function of their diameter. The dependence of the surface recombination on the SiGe composition could, however, not be yet addressed given the sample-to-sample variations of the state-of-the-art hex-SiGe nanowires. With the aforementioned experiments, we demonstrate that at room temperature, under high excitation conditions (a few kW cm–2), the hex-(Si)Ge surface is most likely not a bottleneck for efficient radiative emission under relatively high excitation conditions. This is an important asset for future hex(Si)Ge optoelectronic devices, specifically for nanolasers.

Topics
  • impedance spectroscopy
  • surface
  • photoluminescence
  • experiment
  • Silicon
  • wire
  • Germanium