Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2020Morphology-Graded Silicon Nanowire Arrays via Chemical Etching53citations

Places of action

Chart of shared publication
Bourret, Gilles R.
1 / 4 shared
Diwald, Oliver
1 / 14 shared
Rey, Marcel
1 / 3 shared
Mahdavi, Hossein
1 / 2 shared
Wendisch, Fedja J.
1 / 1 shared
Musso, Maurizio
1 / 6 shared
Vogel, Nicolas
1 / 13 shared
Chart of publication period
2020

Co-Authors (by relevance)

  • Bourret, Gilles R.
  • Diwald, Oliver
  • Rey, Marcel
  • Mahdavi, Hossein
  • Wendisch, Fedja J.
  • Musso, Maurizio
  • Vogel, Nicolas
OrganizationsLocationPeople

article

Morphology-Graded Silicon Nanowire Arrays via Chemical Etching

  • Bourret, Gilles R.
  • Diwald, Oliver
  • Rey, Marcel
  • Mahdavi, Hossein
  • Abazari, Mehri
  • Wendisch, Fedja J.
  • Musso, Maurizio
  • Vogel, Nicolas
Abstract

<p>We report on a quick, simple, and cost-effective solution-phase approach to prepare centimeter-sized morphology-graded vertically aligned Si nanowire arrays. Gradients in the nanowire diameter and shape are encoded through the macroscale substrate via a "dip-etching" approach, where the substrate is removed from a KOH etching solution at a constant rate, while morphological control at the nanowire level is achieved via sequential metal-assisted chemical etching and KOH etching steps. This combined approach provides control over light absorption and reflection within the nanowire arrays at both the macroscale and nanoscale, as shown by UV-vis spectroscopy and numerical three-dimensional finite-difference time-domain simulations. Macroscale morphology gradients yield arrays with gradually changing optical properties. Nanoscale morphology control is demonstrated by synthesizing arrays of bisegmented nanowires, where the nanowires are composed of two distinct segments with independently controlled lengths and diameters. Such nanowires are important to tailor light-matter interactions in functional devices, especially by maximizing light absorption at specific wavelengths and locations within the nanowires.</p>

Topics
  • impedance spectroscopy
  • phase
  • simulation
  • Silicon
  • etching
  • Ultraviolet–visible spectroscopy
  • aligned