Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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693.932 PEOPLE
693.932 People People

693.932 People

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Naji, M.
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Tittonen, Ilkka

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Aalto University

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (11/11 displayed)

  • 2024Cathodic arc deposited tetrahedral amorphous carbon as thin film contact pressure sensing material1citations
  • 2023Atomic layer deposition of Zr-sandwiched ZnO thin films for transparent thermoelectrics9citations
  • 2023Advanced deposition tools for the development of oxide thin filmscitations
  • 2021Computational Study Revealing the Influence of Surface Phenomena in p-GaAs Water-Splitting Cells6citations
  • 2021Thermoelectric Characteristics of InAs Nanowire Networks Directly Grown on Flexible Plastic Substrates4citations
  • 2020Enhanced Thermoelectric Transport and Stability in Atomic Layer Deposited HfO2/ZnO and TiO2/ZnO Sandwiched Multilayer Thin Films20citations
  • 2020Enhanced Thermoelectric Transport and Stability in Atomic Layer Deposited HfO2/ZnO and TiO2/ZnO Sandwiched Multilayer Thin Films20citations
  • 2018Thin-film thermoelectric devices for energy harvesting and material parameter extractioncitations
  • 2018Inkjet Printed Large-Area Flexible Few-Layer Graphene Thermoelectrics157citations
  • 2017Optimization of Cuprous Oxides Thin Films to be used as Thermoelectric Touch Detectors28citations
  • 2016Thermal conductivity of amorphous Al 2 O 3 / TiO 2 nanolaminates deposited by atomic layer deposition32citations

Places of action

Chart of shared publication
Haikola, Juha
1 / 1 shared
Kolehmainen, Jukka
1 / 6 shared
Tervakangas, Sanna
1 / 6 shared
Tossi, Camilla
5 / 6 shared
Raju, Ramesh
2 / 3 shared
Volin, Ulrika
1 / 1 shared
Koskinen, Tomi
2 / 4 shared
Singh, Dr Aadesh Pratap
1 / 1 shared
Laouadi, Ornella
1 / 1 shared
Hällström, Lassi
1 / 2 shared
Khayrudinov, Vladislav
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Jiang, Hua
1 / 45 shared
Haggren, Tuomas
1 / 11 shared
Emadi, Fahimeh
1 / 6 shared
Lipsanen, Harri
2 / 65 shared
Juntunen, Taneli
5 / 8 shared
Ishikawa, Yasuaki
2 / 4 shared
Etula, Jarkko
2 / 20 shared
Felizco, Jenichi Clairvaux
1 / 1 shared
Uenuma, Mutsunori
2 / 3 shared
Uraoka, Yukiharu
2 / 7 shared
Clairvaux Felizco, Jenichi
1 / 1 shared
Ritasalo, Riina
1 / 7 shared
Tappura, Kirsi
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Jaakkola, Kaarle
1 / 1 shared
Albrow-Owen, Tom
1 / 1 shared
Sun, Zhipei
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Hu, Guohua
1 / 1 shared
Ng, Lwt
1 / 1 shared
Liu, Shouhu
1 / 1 shared
Hasan, Tawfique
1 / 3 shared
Jussila, Henri
1 / 7 shared
Ruoho, Mikko
2 / 6 shared
Howe, Richard C. T.
1 / 1 shared
Figueira, Joana
1 / 4 shared
Ferreira, Isabel
1 / 45 shared
Bianchi, Catarina
1 / 3 shared
Marques, José
1 / 2 shared
Duarte, Paulo
1 / 4 shared
Loureiro, Joana
1 / 4 shared
Hannula, Simo-Pekka
1 / 48 shared
Ali, Saima
1 / 12 shared
Ylivaara, Oili
1 / 12 shared
Puurunen, Riikka
1 / 8 shared
Sintonen, Sakari
1 / 15 shared
Chart of publication period
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Co-Authors (by relevance)

  • Haikola, Juha
  • Kolehmainen, Jukka
  • Tervakangas, Sanna
  • Tossi, Camilla
  • Raju, Ramesh
  • Volin, Ulrika
  • Koskinen, Tomi
  • Singh, Dr Aadesh Pratap
  • Laouadi, Ornella
  • Hällström, Lassi
  • Khayrudinov, Vladislav
  • Jiang, Hua
  • Haggren, Tuomas
  • Emadi, Fahimeh
  • Lipsanen, Harri
  • Juntunen, Taneli
  • Ishikawa, Yasuaki
  • Etula, Jarkko
  • Felizco, Jenichi Clairvaux
  • Uenuma, Mutsunori
  • Uraoka, Yukiharu
  • Clairvaux Felizco, Jenichi
  • Ritasalo, Riina
  • Tappura, Kirsi
  • Jaakkola, Kaarle
  • Albrow-Owen, Tom
  • Sun, Zhipei
  • Hu, Guohua
  • Ng, Lwt
  • Liu, Shouhu
  • Hasan, Tawfique
  • Jussila, Henri
  • Ruoho, Mikko
  • Howe, Richard C. T.
  • Figueira, Joana
  • Ferreira, Isabel
  • Bianchi, Catarina
  • Marques, José
  • Duarte, Paulo
  • Loureiro, Joana
  • Hannula, Simo-Pekka
  • Ali, Saima
  • Ylivaara, Oili
  • Puurunen, Riikka
  • Sintonen, Sakari
OrganizationsLocationPeople

article

Enhanced Thermoelectric Transport and Stability in Atomic Layer Deposited HfO2/ZnO and TiO2/ZnO Sandwiched Multilayer Thin Films

  • Juntunen, Taneli
  • Ishikawa, Yasuaki
  • Tossi, Camilla
  • Tittonen, Ilkka
  • Etula, Jarkko
  • Felizco, Jenichi Clairvaux
  • Uenuma, Mutsunori
  • Uraoka, Yukiharu
Abstract

<p>Herein, enhancements in thermoelectric (TE) performance, both the power factor (PF) and thermal stability, are exhibited by sandwiching HfO2 and TiO2 layers onto atomic layer deposited-ZnO thin films. High-temperature TE measurements from 300 to 450 K revealed an almost two-fold improvement in electrical conductivity for TiO2/ZnO (TZO) samples, primarily owing to an increase in carrier concentration by Ti doping. On the other hand, HfO2/ZnO (HZO) achieved the highest PF values owing to maintaining Seebeck coefficients comparable to pure ZnO. HZO also exhibited excellent stability after multiple thermal cycles, which has not been previously observed for pure or doped ZnO thin films. Such improvement in both TE properties and thermal stability of HZO can be attributed to a shift in crystalline orientation from the a axis to c axis, as well as the high bond dissociation energy of Hf-O, stabilizing the ZnO structure. These unique properties exhibited by HZO and TZO thin films synthesized by atomic layer deposition pave the way for next-generation transparent TE devices.</p>

Topics
  • thin film
  • electrical conductivity
  • atomic layer deposition