Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2023Crystallization Process for High-Quality Cs0.15FA0.85PbI2.85Br0.15Film Deposited via Simplified Sequential Vacuum Evaporation10citations
  • 2022Achieving 23.83% conversion efficiency in silicon heterojunction solar cell with ultra-thin MoOx hole collector layer via tailoring (i)a-Si:H/MoOx interface62citations

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Savenije, Tom J.
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Kerklaan, Mels
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Ibrahim, Bahiya
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Mazzarella, Luana
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Bannenberg, Lars
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Zhao, Jiashang
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Wang, Haoxu
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Isabella, Olindo
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Procel, Paul
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Co-Authors (by relevance)

  • Savenije, Tom J.
  • Kerklaan, Mels
  • Ibrahim, Bahiya
  • Mazzarella, Luana
  • Bannenberg, Lars
  • Zhao, Jiashang
  • Wang, Haoxu
  • Isabella, Olindo
  • Procel, Paul
  • Cao, Liqi
  • Zhao, Yifeng
  • Tichelaar, F. D.
  • Santbergen, Rudi
  • Yang, Guangtao
  • Alcañiz Moya, Alba
  • Özkol, Engin
  • Han, Can
  • Yao, Zhirong
  • Zeman, Miro
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document

Crystallization Process for High-Quality Cs0.15FA0.85PbI2.85Br0.15Film Deposited via Simplified Sequential Vacuum Evaporation

  • Savenije, Tom J.
  • Kerklaan, Mels
  • Ibrahim, Bahiya
  • Mazzarella, Luana
  • Bannenberg, Lars
  • Zhao, Jiashang
  • Wang, Haoxu
  • Isabella, Olindo
  • Yan, Jin
Abstract

<p>Multiple-source thermal evaporation is emerging as an excellent technique to obtain perovskite (PVK) materials for solar cell applications due to its solvent-free processing, accurate control of stoichiometric ratio, and potential for scalability. Nevertheless, the currently reported layer-by-layer deposition approach is afflicted by long processing times caused by the multiple repetitions of thin films, which hinder industrial uptake. On the other hand, the coevaporation entails higher complexity due to the challenges of controlling the sublimation of multiple sources simultaneously. In this work, we propose a simplified approach consisting of a single-cycle deposition (SCD) of three thick precursor layers to obtain high-quality Cs0.15FA0.85PbI2.85Br0.15 (CsFAPbIBr) films. After annealing, the optimized PVK film exhibits comparable properties to the one deposited by multicycle deposition in terms of crystal structure, in-depth uniformity, and optoelectrical properties. Also, the formation and evolution of SCD PVK during annealing are investigated. We found that, in the competitive processes of precursor diffusion and reaction, the presence of cesium bromide can assist precursor mixing driven by the annealing treatment, demonstrating a reaction-limited process in the PVK conversion. With this simplified SCD approach, a PVK film is obtained with expected optical and opto-electronic properties, providing an appealing way for future thermally evaporated PVK device preparation. </p>

Topics
  • Deposition
  • perovskite
  • impedance spectroscopy
  • thin film
  • annealing
  • crystallization
  • evaporation