Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
693.932 People People

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Naji, M.
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2024Wafer-scale development, characterization, and high temperature stabilization of epitaxial Cr2O3 films grown on Ru(0001)citations
  • 2019Approaching the Intrinsic Limit in Transition Metal Diselenides via Point Defect Control208citations
  • 2013Grain growth and the puzzle of its stagnation in thin films: The curious tale of a tail and an ear97citations
  • 2012Grain growth and the puzzle of its stagnation in thin films: A detailed comparison of experiments and simulations14citations

Places of action

Chart of shared publication
Daughtry, Maximillian
1 / 1 shared
Cumston, Quintin
1 / 1 shared
Coffey, Kevin
3 / 3 shared
Kaden, William
1 / 1 shared
Hegazy, Ahmed R.
1 / 1 shared
Santos, Elton J. G.
1 / 13 shared
Kim, Bumho
1 / 2 shared
Rhodes, Daniel
1 / 1 shared
Kerelsky, Alexander
1 / 1 shared
Hone, James
1 / 10 shared
Edelberg, Drew
1 / 1 shared
Zangiabadi, Amirali
1 / 1 shared
Ardelean, Jenny
1 / 1 shared
Wang, Jue
1 / 2 shared
Zu, Rui
1 / 1 shared
Marianetti, Chris
1 / 1 shared
Kim, Chanul
1 / 1 shared
Pasupathy, Abhay N.
1 / 2 shared
Zhu, Xiaoyang
1 / 4 shared
Embon, Lior
1 / 1 shared
Scullion, Declan
1 / 4 shared
Balicas, Luis
1 / 3 shared
Abhinandan, Antony
1 / 1 shared
Eggeling, Eva
2 / 2 shared
Rollett, Anthony D.
1 / 14 shared
Kinderlehrer, David
2 / 2 shared
Sharp, Richard
2 / 2 shared
Taasan, S.
1 / 2 shared
Yao, Bo
1 / 1 shared
Shyu, Terry
1 / 1 shared
Roberts, Scott
1 / 1 shared
Taasan, Shlomo
1 / 1 shared
Sun, Tik
1 / 1 shared
Rollett, Anthony
1 / 7 shared
Chart of publication period
2024
2019
2013
2012

Co-Authors (by relevance)

  • Daughtry, Maximillian
  • Cumston, Quintin
  • Coffey, Kevin
  • Kaden, William
  • Hegazy, Ahmed R.
  • Santos, Elton J. G.
  • Kim, Bumho
  • Rhodes, Daniel
  • Kerelsky, Alexander
  • Hone, James
  • Edelberg, Drew
  • Zangiabadi, Amirali
  • Ardelean, Jenny
  • Wang, Jue
  • Zu, Rui
  • Marianetti, Chris
  • Kim, Chanul
  • Pasupathy, Abhay N.
  • Zhu, Xiaoyang
  • Embon, Lior
  • Scullion, Declan
  • Balicas, Luis
  • Abhinandan, Antony
  • Eggeling, Eva
  • Rollett, Anthony D.
  • Kinderlehrer, David
  • Sharp, Richard
  • Taasan, S.
  • Yao, Bo
  • Shyu, Terry
  • Roberts, Scott
  • Taasan, Shlomo
  • Sun, Tik
  • Rollett, Anthony
OrganizationsLocationPeople

article

Approaching the Intrinsic Limit in Transition Metal Diselenides via Point Defect Control

  • Santos, Elton J. G.
  • Kim, Bumho
  • Rhodes, Daniel
  • Kerelsky, Alexander
  • Hone, James
  • Edelberg, Drew
  • Zangiabadi, Amirali
  • Ardelean, Jenny
  • Wang, Jue
  • Zu, Rui
  • Marianetti, Chris
  • Kim, Chanul
  • Pasupathy, Abhay N.
  • Zhu, Xiaoyang
  • Embon, Lior
  • Scullion, Declan
  • Barmak, Katayun
  • Balicas, Luis
  • Abhinandan, Antony
Abstract

Two dimensional (2D) transition-metal dichalcogenide (TMD) based semiconductors have generated intense recent interest due to their novel optical and electronic properties, and potential for applications. In this work, we characterize the atomic and electronic nature of intrinsic point defects found in single crystals of these materials synthesized by two different methods - chemical vapor transport and self-flux growth. Using a combination of scanning tunneling microscopy (STM) and scanning transmission electron microscopy (STEM), we show that the two major intrinsic defects in these materials are metal vacancies and chalcogen antisites. We show that by control of the synthetic conditions, we can reduce the defect concentration from above 1013 /cm2 to below 1011 /cm2. Because these point defects act as centers for non-radiative recombination of excitons, this improvement in material quality leads to a hundred-fold increase in the radiative recombination efficiency.

Topics
  • single crystal
  • semiconductor
  • transmission electron microscopy
  • scanning tunneling microscopy
  • point defect