Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2016Thermal Conductivity Comparison of Indium Gallium Zinc Oxide Thin Films36citations

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Medvedeva, Julia E.
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Cui, Boya
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Xia, Yu
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Marks, Tobin J.
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Chang, Robert P. H.
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Buchholz, D. Bruce
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Bedzyk, Michael J.
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2016

Co-Authors (by relevance)

  • Medvedeva, Julia E.
  • Cui, Boya
  • Xia, Yu
  • Marks, Tobin J.
  • Chang, Robert P. H.
  • Smith, Jeremy
  • Keane, Denis
  • Zeng, Li
  • Buchholz, D. Bruce
  • Bedzyk, Michael J.
  • Grayson, M.
OrganizationsLocationPeople

article

Thermal Conductivity Comparison of Indium Gallium Zinc Oxide Thin Films

  • Medvedeva, Julia E.
  • Facchetti, Antonio F.
  • Cui, Boya
  • Xia, Yu
  • Marks, Tobin J.
  • Chang, Robert P. H.
  • Smith, Jeremy
  • Keane, Denis
  • Zeng, Li
  • Buchholz, D. Bruce
  • Bedzyk, Michael J.
  • Grayson, M.
Abstract

The cross-plane thermal conductivity of InGaZnO (IGZO) thin films was measured using the 3<i>ω</i> technique from 18 to 300 K. The studied morphologies include amorphous (a-IGZO), semicrystalline (semi-c-IGZO), and<i> c</i>-axis-aligned single-crystal-like IGZO (c-IGZO) grown by pulsed laser deposition (PLD) as well as a-IGZO deposited by sputtering and by solution combustion processing. The atomic structures of the amorphous and crystalline films were simulated with <i>ab initio</i> molecular dynamics. The film quality and texturing information was assessed by X-ray diffraction and grazing incidence wide-angle X-ray scattering. X-ray reflectivity was also conducted to quantify film densities and porosities. All the high-density films exhibit an empirical power-law temperature dependence of the thermal conductivity <i>κ ∼ T</i><sup>0.6</sup> in the specified temperature range. Among the PLD dense films, semi-c-IGZO exhibits the highest thermal conductivity, remarkably exceeding both films with more order (c-IGZO) and with less order (a-IGZO) by a factor of 4. The less dense combustion-synthesized films, on the other hand, exhibited lower thermal conductivity, quantitatively consistent with a porous film using either an effective medium or percolation model. All samples are consistent with the porosity-adapted Cahill-Pohl (p-CP) model of minimum thermal conductivity.

Topics
  • porous
  • density
  • amorphous
  • x-ray diffraction
  • thin film
  • zinc
  • molecular dynamics
  • laser emission spectroscopy
  • combustion
  • porosity
  • pulsed laser deposition
  • thermal conductivity
  • wide-angle X-ray scattering
  • Gallium
  • aligned
  • Indium
  • semicrystalline