Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2015Description and Test of a New Multilayer Thin Film Vapor Deposition Apparatus for Organic Semiconductor Materials33citations

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Costa, Jcs
1 / 12 shared
Torres, Mc
1 / 1 shared
Santos, Lmnbf
1 / 23 shared
Rocha, Rm
1 / 1 shared
Mendes, A.
1 / 22 shared
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2015

Co-Authors (by relevance)

  • Costa, Jcs
  • Torres, Mc
  • Santos, Lmnbf
  • Rocha, Rm
  • Mendes, A.
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article

Description and Test of a New Multilayer Thin Film Vapor Deposition Apparatus for Organic Semiconductor Materials

  • Costa, Jcs
  • Torres, Mc
  • Santos, Lmnbf
  • Vaz, Icm
  • Rocha, Rm
  • Mendes, A.
Abstract

In this work the description, test, and performance of a new vacuum apparatus for thin film vapor deposition (ThinFilmVD) of organic semiconductor materials are presented. The apparatus is able to fabricate single, multilayer/composites, or hybrid thin films using four independent, organic or inorganic, vapor deposition sources (Knudsen cells type), and the vapor mass flow is condensed onto a substrate surface (temperature regulated). The same apparatus could be also used to measure vapor pressures according to the Knudsen effusion methodology. Vapor pressures and thermodynamic properties of sublimation measured by Knudsen effusion of some reference organic materials (benzoic acid, anthracene, triphenylene, benzanthrone, 1,3,5-triphenylbenzene, perylene) were used to evaluate and test the performance of the apparatus. Moreover, nanostructures of thin films and composite materials of relevant charge transport and electroluminescent materials were deposited onto an indium-tin oxide (ITO) surface, and the morphology and thin film thickness were evaluated by scanning electron microscopy (SEM), exploring the effect of different mass flow rates and deposition time. The new physical vapor deposition apparatus based in four Knudsen effusion cells with an accurate mass flow control was designed to assemble well-defined (composition, morphology, thickness) thin films of organic semiconductors based on their volatility. The described apparatus presents a high versatility to the fabrication of single/multilayer thin films, as-grown crystals, and hybrid micro- and nanostructured materials.

Topics
  • impedance spectroscopy
  • surface
  • scanning electron microscopy
  • thin film
  • semiconductor
  • physical vapor deposition
  • composite
  • tin
  • Indium