Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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977 Locations available

693.932 PEOPLE
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Show results for 693.932 people that are selected by your search filters.

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Naji, M.
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (10/10 displayed)

  • 2023New insight into degradation mechanisms of conductive and thermally resistant polyaniline films6citations
  • 2023Comparison of Tiling Artifact Removal Methods in Secondary Ion Mass Spectrometry Images1citations
  • 2023Two-Dimensional and Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry Image Feature Extraction Using a Spatially Aware Convolutional Autoencoder15citations
  • 2023Exploring the Relationship between Polymer Surface Chemistry and Bacterial Attachment Using ToF‐SIMS and Self‐Organizing maps8citations
  • 2022Applications of multivariate analysis and unsupervised machine learning to ToF-SIMS images of organic, bioorganic, and biological systemscitations
  • 2020ToF-SIMS and machine learning for single-pixel molecular discrimination of an acrylate polymer microarraycitations
  • 2020Analyzing 3D Hyperspectral ToF-SIMS Depth Profile Data Using Self-Organizing Map-Relational Perspective Mapping17citations
  • 2018Distinguishing chemically similar polyamide materials with ToF-SIMS using self-organizing maps and a universal data matrix24citations
  • 2017Determining the limit of detection of surface bound antibody8citations
  • 2016Chromium functionalized diglyme plasma polymer coating enhances enzyme-linked immunosorbent assay performance9citations

Places of action

Chart of shared publication
Martinez Botella, Ivan
1 / 1 shared
Gozukara, Yesim
1 / 3 shared
Yalcin, Dilek
1 / 3 shared
Bruton, Eric A.
1 / 1 shared
Kinlen, Patrick
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Kohl, Tom
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Bamford, Sarah
1 / 1 shared
Espiritu, Maria
1 / 1 shared
Alexander, David
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Howard, Shaun
1 / 4 shared
Greaves, Mark
1 / 2 shared
Muir, Benjamin Ward
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Crewther, Sheila
1 / 1 shared
Halliday, Mark
1 / 1 shared
Gardner, Wil
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Chouinard, Philippe
1 / 1 shared
Scurr, David
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Torney, Steven
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Winkler, David
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Pietersz, Geoffrey
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Cutts, Suzanne M.
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Hook, Andrew L.
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Chang, Chien-Yi
1 / 1 shared
Ballabio, Davide
3 / 5 shared
Martyn, C. Davies
1 / 1 shared
Wong, See Yoong
1 / 2 shared
Alexander, Morgan
2 / 4 shared
Williams, Paul
1 / 7 shared
Mei, Ying
1 / 2 shared
Hook, Andrew
1 / 1 shared
Muir, Ben
3 / 10 shared
Winkler, Dave
2 / 17 shared
Madiona, Robert
3 / 3 shared
Bamford, S.
1 / 1 shared
Welch, Nicholas
2 / 2 shared
Jones, Robert
1 / 2 shared
Chart of publication period
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2022
2020
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2016

Co-Authors (by relevance)

  • Martinez Botella, Ivan
  • Gozukara, Yesim
  • Yalcin, Dilek
  • Bruton, Eric A.
  • Kinlen, Patrick
  • Kohl, Tom
  • Bamford, Sarah
  • Espiritu, Maria
  • Alexander, David
  • Howard, Shaun
  • Greaves, Mark
  • Muir, Benjamin Ward
  • Crewther, Sheila
  • Halliday, Mark
  • Gardner, Wil
  • Chouinard, Philippe
  • Scurr, David
  • Torney, Steven
  • Winkler, David
  • Pietersz, Geoffrey
  • Cutts, Suzanne M.
  • Hook, Andrew L.
  • Chang, Chien-Yi
  • Ballabio, Davide
  • Martyn, C. Davies
  • Wong, See Yoong
  • Alexander, Morgan
  • Williams, Paul
  • Mei, Ying
  • Hook, Andrew
  • Muir, Ben
  • Winkler, Dave
  • Madiona, Robert
  • Bamford, S.
  • Welch, Nicholas
  • Jones, Robert
OrganizationsLocationPeople

article

Distinguishing chemically similar polyamide materials with ToF-SIMS using self-organizing maps and a universal data matrix

  • Muir, Ben
  • Madiona, Robert
  • Winkler, Dave
  • Bamford, S.
  • Pigram, Paul
Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is advancing rapidly, providing instruments with growing capabilities and resolution. The data sets generated by these instruments are likewise increasing dramatically in size and complexity. Paradoxically, methods for efficient analysis of these large, rich data sets have not improved at the same rate. Clearly, more effective computational methods for analysis of ToF-SIMS data are becoming essential. Several research groups are customizing standard multivariate analytical tools to decrease computational demands, provide user-friendly interfaces, and simplify identification of trends and features in large ToF-SIMS data sets. We previously applied mass segmented peak lists to data from PMMA, PTFE, PET, and LDPE. Self-organizing maps (SOMs), a type of artificial neural network (ANN), classified the polymers based on their molecular composition and primary ion probe type more effectively than simple PCA. The effectiveness of this approach led us to question whether it would be useful in distinguishing polymers that were very similar. How sensitive is the technique to changes in polymer chemical structure and composition? To address this question, we generated ToF-SIMS ion peak signatures for seven nylon polymers with similar chemistries and used our up-binning and SOM approach to classify and cluster the polymers. The widely used linear PCA method failed to separate the samples. Supervised and unsupervised training of SOMs using positive or negative ion mass spectra resulted in effective classification and separation of the seven nylon polymers. Our SOM classification method has proven to be tolerant of minor sample irregularities, sample-to-sample variations, and inherent data limitations including spectral resolution and noise. We have demonstrated the potential of machine learning methods to analyze ToF-SIMS data more effectively than traditional methods. Such methods are critically important for future complex data analysis and provide a pipeline for rapid classification and identification of features and similarities in large data sets.

Topics
  • impedance spectroscopy
  • cluster
  • polymer
  • spectrometry
  • selective ion monitoring
  • secondary ion mass spectrometry
  • machine learning