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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Ledenyov, Dimitri
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Publications (4/4 displayed)
- 2004Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonatorscitations
- 2004Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonatorcitations
- 2003Microwave Properties of Yttrium Vanadate Crystals at Cryogenic Temperatures
- 2003Microwave characterisation of CaF2 at cryogenic temperatures using a dielectric resonator techniquecitations
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article
Microwave characterisation of CaF2 at cryogenic temperatures using a dielectric resonator technique
Abstract
<p>Properties of calcium fluoride (CaF<sub>2</sub>) have been well researched at UV, visible and IR range of frequencies but not at microwave frequencies. In this work we report the loss tangent and the real part of relative permittivity ε <sub>r</sub> of CaF<sub>2</sub> measured in the temperature range 15-81 K and at frequency 29.25 GHz. The tan δ and ε <sub>r</sub> were determined by measurements of the resonant frequency and the Q <sub>0</sub>-factor of a TE<sub>011</sub> mode cylindrical copper cavity with superconducting plates containing the sample under test. The measured ε <sub>r</sub> of CaF<sub>2</sub> was found to change from 6.484 to 6.505, and the tan δ from 3.1×10<sup>-6</sup> to 22.7×10<sup>-6</sup> when temperature was varied from 15 to 81 K. Due to the low losses CaF<sub>2</sub> can be useful in construction of high Q-factor microwave circuits and devices operating at cryogenic temperatures. © 2003 Elsevier Ltd. All rights reserved.</p>