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Jackson, Howard E.
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Publications (8/8 displayed)
- 2020Exploring the band structure of Wurtzite InAs nanowires using photocurrent spectroscopycitations
- 2012Photomodulated Rayleigh scattering from single semiconductor nanowires
- 2011Photomodulated rayleigh scattering of single semiconductor nanowirescitations
- 2011III-V semiconductor nanowires for optoelectronic device applicationscitations
- 2009Carrier dynamics and quantum confinement in type II ZB-WZ InP nanowire homostructures
- 2008High purity GaAs nanowires free of planar defectscitations
- 2002Mechanics of load transfer from matrix to fiber under flexural loading in a glass matrix composite using microfluorescence spectroscopycitations
- 2001Characterization of residual stresses in a sapphire-fiber-reinforced glass-matrix composite by micro-fluorescence spectroscopycitations
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article
Characterization of residual stresses in a sapphire-fiber-reinforced glass-matrix composite by micro-fluorescence spectroscopy
Abstract
esidual stress in fibers of a sapphire-fiber-reinforced glass-matrix composite arising from thermal expansion mismatch is characterized by measuring the shift of the optical fluorescence lines of Cr+3 in sapphire. The stress is found to vary along the fiber length as well as across the fiber cross-section for an uncoated fiber embedded in a glass matrix. Some finite residual stress is also measured at the fiber ends. Analytical models to explain the experimentally measured stress variations are proposed. The high spatial resolution of the microprobe spectrometer is demonstrated for mapping stresses across a specific section of the composite.