Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2000Structural properties and surface morphology of laser-deposited amorphous carbon and carbon nitride films127citations

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Chart of shared publication
Decossas, S.
1 / 1 shared
Comin, F.
1 / 2 shared
Sancrotti, M.
1 / 3 shared
Chevrier, J.
1 / 3 shared
Chart of publication period
2000

Co-Authors (by relevance)

  • Decossas, S.
  • Comin, F.
  • Sancrotti, M.
  • Chevrier, J.
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article

Structural properties and surface morphology of laser-deposited amorphous carbon and carbon nitride films

  • Decossas, S.
  • Schmithusen, F.
  • Comin, F.
  • Sancrotti, M.
  • Chevrier, J.
Abstract

<p>A study of the relationship between structure and growth parameters for existing and candidate carbon-based protective coatings has been carried out. In particular, diamond-like carbon (DLC) and carbon nitride thin films were deposited on silicon wafers by pulsed Nd:YAG laser (wavelength 532 nm) ablation of graphite in high vacuum (p = 1.5 x 10<sup>-7</sup> Pa) and in a nitrogen atmosphere (p = 13 Pa). The composition (N/C ratio), the structural and electronic properties and the surface morphology of the deposited films were investigated as a function of laser fluence (1-12 J/cm<sup>2</sup>). The highest N/C ratio 0.40 was obtained with a laser fluence of 12 J/cm<sup>2</sup>; for this nitrogen concentration X-ray photoelectron spectroscopy (XPS) reveals an increase of C-N bonds instead of C=N bonds with respect to lower concentrations. Electron energy loss spectroscopy (EELS) and XPS show an increase of sp<sup>2</sup> carbon bonded sites in the DLC films deposited with lower laser fluences in agreement with the theory of the so-called sub-implantation model. EELS also reveals a gradient in the chemical nature of the films through the thickness. Atomic force microscopy analysis shows that the root-mean-squared roughness of the DLC samples is about 3 Å over the laser fluence range investigated. (C) 2000 Elsevier Science S.A. All rights reserved.</p>

Topics
  • impedance spectroscopy
  • surface
  • amorphous
  • Carbon
  • theory
  • thin film
  • x-ray photoelectron spectroscopy
  • atomic force microscopy
  • Nitrogen
  • nitride
  • Silicon
  • electron energy loss spectroscopy