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Katkauskė, Oresta
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Publications (3/3 displayed)
- 2011Scandium stabilized zirconium thin films formation by e-beam techniquecitations
- 2011Influence of initial powder particle size on yttrium stabilized zirconium thin films formed by e-beam techniquecitations
- 2009The properties of samarium doped ceria oxide thin films grown by e-beam deposition techniquecitations
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article
The properties of samarium doped ceria oxide thin films grown by e-beam deposition technique
Abstract
One of the main challenges in today's solid oxide fuel cell (SOFC) technology is the reduction of their operating temperature. New types of oxygen ion conducting materials are currently under investigation to overcome the problems which SOFC faces at high temperatures. Samarium doped ceria oxide (SDC) was the material of investigation in this work. Optical quartz (SiO2) and Fe–Ni–Cr alloy (Alloy 600) were the two types of chosen substrates onto which SDC thin films were deposited by e-beam evaporation technique. The bias voltage was applied to the substrate during film growth. It had an influence on film formation, its microstructure and density because of the ionized particles presence in the SDC vapor stream. Changes in crystallite size and surface morphology were determined from X-ray diffraction data and scanning electron microscopy images. Influence of bias voltage on porosity of formed SDC thin films on optical quartz were calculated from transmittance spectra data by using Swanepoel method. The porosity decreases up to 12% by decreasing bias voltage from 0 to −150 V.