| People | Locations | Statistics |
|---|---|---|
| Naji, M. |
| |
| Motta, Antonella |
| |
| Aletan, Dirar |
| |
| Mohamed, Tarek |
| |
| Ertürk, Emre |
| |
| Taccardi, Nicola |
| |
| Kononenko, Denys |
| |
| Petrov, R. H. | Madrid |
|
| Alshaaer, Mazen | Brussels |
|
| Bih, L. |
| |
| Casati, R. |
| |
| Muller, Hermance |
| |
| Kočí, Jan | Prague |
|
| Šuljagić, Marija |
| |
| Kalteremidou, Kalliopi-Artemi | Brussels |
|
| Azam, Siraj |
| |
| Ospanova, Alyiya |
| |
| Blanpain, Bart |
| |
| Ali, M. A. |
| |
| Popa, V. |
| |
| Rančić, M. |
| |
| Ollier, Nadège |
| |
| Azevedo, Nuno Monteiro |
| |
| Landes, Michael |
| |
| Rignanese, Gian-Marco |
|
David, Christian
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (9/9 displayed)
- 2023Directly observing atomic-scale relaxations of a glass forming liquid using femtosecond X-ray photon correlation spectroscopycitations
- 2023Hard X-ray stereographic microscopy for single-shot differential phase imagingcitations
- 2022Microstructure effects on the phase transition behavior of a prototypical quantum materialcitations
- 2019Fabrication of Au gratings by seedless electroplating for X-ray grating interferometrycitations
- 2015Mapping the morphological changes of deposited gold nanoparticles across an imprinted groovecitations
- 2014Halo suppression in full-field x-ray Zernike phase contrast microscopycitations
- 2010Direct e-beam writing of high aspect ratio nanostructures in PMMA: A tool for diffractive X-ray optics fabricationcitations
- 2009Advanced thin film technology for ultrahigh resolution x-ray microscopycitations
- 2007Modification of the porous network by salt crystallization in experimentally weathered sedimentary stonescitations
Places of action
| Organizations | Location | People |
|---|
article
Advanced thin film technology for ultrahigh resolution x-ray microscopy
Abstract
Further progress in the spatial resolution of X-ray microscopes is currently impaired by fundamental limitations in the production of X-ray diffractive lenses. Here, we demonstrate how advanced thin film technologies can be applied to boost the fabrication and characterization of ultrahigh resolution X-ray optics. Specifically, Fresnel zone plates were fabricated by combining electron-beam lithography with atomic layer deposition and focused ion beam induced deposition. They were tested in a scanning transmission X-ray microscope at 1.2 keV photon energy using line pair structures of a sample prepared by metalorganic vapor phase epitaxy. For the first time in X-ray microscopy, features below 10nm in width were resolved. (C) 2009 Elsevier B.V. All rights reserved.