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Calzada, Ml
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Publications (6/6 displayed)
- 2017The role of PbTiO3 layers in piezoelectric multilayer composite films based on Pb(Mg1/3Nb2/3)O-3-PbTiO3citations
- 2014Morphotropic Phase Boundary in Solution- Derived ( Bi0.5Na0.5) 1-xBaxTiO3 Thin Films: Part II Functional Properties and Phase Stabilitycitations
- 2012Properties of multilayer composite thin films based on morphotropic phase boundary Pb(Mg1/3Nb2/3)O-3-PbTiO3citations
- 2005Direct characterization of nanoscale domain switching and local piezoelectric loops of (Pb,La)TiO3 thin films by piezoresponse force microscopycitations
- 2003Stress-induced suppression of piezoelectric properties in PbTiO3 : La thin films via scanning force microscopycitations
- 2000Dependence of functional properties on processing in sol-gel (Pb, La)TiO3 thin films
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article
The role of PbTiO3 layers in piezoelectric multilayer composite films based on Pb(Mg1/3Nb2/3)O-3-PbTiO3
Abstract
The sharp decrease of the remnant ferroelectric and piezoelectric properties of Pb(Mg1/3Nb2/3)O-3-PbTiO3 (PMNT) thin films close to the Morphotropic Phase Boundary (MPB) respect to their corresponding bulk ceramics is a major drawback for their integration in microdevices. In order to take full advantage of the excellent piezoelectric properties of polycrystalline PMNT in thin film form, a multilayer configuration with PbTiO3 (PT) layers is proposed. The PT layers generate an internal electric bias within the PMNT layer, which anchor an induced polarization in it. This results in a significant improvement of the piezoelectric behavior, obtaining remnant piezoelectric coefficients, d(33) (r), as high as 67 pm V-1. The role of the thickness of the PT layers used is discussed, in order to find the optimum configuration for these multilayers.