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De La Cruz, Jp
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Publications (4/4 displayed)
- 2017The role of PbTiO3 layers in piezoelectric multilayer composite films based on Pb(Mg1/3Nb2/3)O-3-PbTiO3citations
- 2014Morphotropic Phase Boundary in Solution- Derived ( Bi0.5Na0.5) 1-xBaxTiO3 Thin Films: Part II Functional Properties and Phase Stabilitycitations
- 2011Lithium-induced dielectric relaxations in potassium tantalate ceramicscitations
- 2011Synthesis of orthorhombic rare-earth manganite thin films by a novel chemical solution routecitations
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article
The role of PbTiO3 layers in piezoelectric multilayer composite films based on Pb(Mg1/3Nb2/3)O-3-PbTiO3
Abstract
The sharp decrease of the remnant ferroelectric and piezoelectric properties of Pb(Mg1/3Nb2/3)O-3-PbTiO3 (PMNT) thin films close to the Morphotropic Phase Boundary (MPB) respect to their corresponding bulk ceramics is a major drawback for their integration in microdevices. In order to take full advantage of the excellent piezoelectric properties of polycrystalline PMNT in thin film form, a multilayer configuration with PbTiO3 (PT) layers is proposed. The PT layers generate an internal electric bias within the PMNT layer, which anchor an induced polarization in it. This results in a significant improvement of the piezoelectric behavior, obtaining remnant piezoelectric coefficients, d(33) (r), as high as 67 pm V-1. The role of the thickness of the PT layers used is discussed, in order to find the optimum configuration for these multilayers.