| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Blackburn, E.
Lund University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (6/6 displayed)
- 2023Concomitant interfacial spin fractal transformation and exchange bias in a magnetic shape memory alloy
- 2019Magnetic phase diagram of the quantum spin chain compound SrCo<sub>2</sub>V<sub>2</sub>O<sub>8</sub>: a single-crystal neutron diffraction studycitations
- 2019Magnetic phase diagram of the quantum spin chain compound SrCo2V2O8 : A single-crystal neutron diffraction studycitations
- 2019Scalable synthesis of dispersible iron carbide (Fe3C) nanoparticles by ‘nanocasting’citations
- 2016Magnetoresistance magnetometry of (Ni80Fe20)1-xlrx wires with varying anisotropic magnetoresistance ratiocitations
- 2012Dielectric properties of pulsed-laser deposited indium tin oxide thin filmscitations
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article
Dielectric properties of pulsed-laser deposited indium tin oxide thin films
Abstract
Polycrystalline tin-doped indium oxide (ITO) thin films were prepared by Pulsed Laser Deposition with an ITO (In<sub>2</sub>O<sub>3</sub>-10 wt.% SnO<sub>2</sub>) ceramic target and deposited on transparent borosilicate glass substrates between room temperature (RT) and 400 °C. The RT grown specimen was structurally investigated by Transmission Electron Microscopy, Scanning Electron Microscopy, Atomic Force Microscopy and X-Ray Diffraction. It contained both amorphous and crystalline phases. The electro-optical properties of the RT-grown sample were almost similar to those of the samples grown at higher temperatures. Finally, Scanning Transmission Electron Microscopy–Valence Electron Energy Loss Spectroscopy was used to derive locally dielectric properties which were compared with ellipsometry measurements in the 1.5–5.5 eV range using a Tauc–Lorentz model.