Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2010High quality ZnO47citations

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Chart of shared publication
Rosén, Johanna
1 / 54 shared
Lim, Sunnie H. N.
1 / 1 shared
Andersson, Joakim
1 / 7 shared
Anders, André
1 / 11 shared
Mcfarland, Mike
1 / 1 shared
Chart of publication period
2010

Co-Authors (by relevance)

  • Rosén, Johanna
  • Lim, Sunnie H. N.
  • Andersson, Joakim
  • Anders, André
  • Mcfarland, Mike
OrganizationsLocationPeople

article

High quality ZnO

  • Rosén, Johanna
  • Lim, Sunnie H. N.
  • Andersson, Joakim
  • Anders, André
  • Mcfarland, Mike
  • Brown, Jeff
Abstract

Aluminum-doped zinc oxide, ZnO:Al or AZO, is a well-known n-type transparent conducting oxide with great potential in a number of applications currently dominated by indium tin oxide. In this study, the optical and electrical properties of AZO thin films deposited on glass and silicon by pulsed filtered cathodic arc deposition are systematically studied. In contrast to magnetron sputtering, this technique does not produce energetic negative ions, and therefore ion damage can be minimized. The quality of the AZO films strongly depends on growth temperature while only marginal improvements are obtained with post-deposition annealing. The best films, grown at a temperature of about 200 °C, have resistivities in the low to mid 10<sup>- 4</sup> Ω cm range with a transmittance better than 85% in the visible part of the spectrum. It is remarkable that relatively good films of small thickness (60 nm) can be fabricated using this method. © 2009 Elsevier B.V.

Topics
  • Deposition
  • impedance spectroscopy
  • thin film
  • aluminium
  • zinc
  • glass
  • glass
  • Silicon
  • annealing
  • tin
  • Indium