Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2010BaxSr1-xTi1.02O3 metal-insulator-metal capacitors on planarized alumina substrates4citations
  • 2008The trade-off between tuning ratio and quality factor of BaxSr1-xTiO3 MIM capacitors on alumina substratescitations
  • 2007Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequenciescitations
  • 2006Electrical characterization of thin film ferroelectric capacitorscitations

Places of action

Chart of shared publication
Hueting, Raymond
4 / 11 shared
Tiggelman, M. P. J.
4 / 4 shared
Reimann, K.
4 / 10 shared
Mauczok, R.
3 / 3 shared
Keur, W.
4 / 5 shared
Liu, J.
2 / 87 shared
Schmitz, Jurriaan
3 / 9 shared
Furukawa, Y.
1 / 1 shared
Beelen, D.
1 / 2 shared
Chart of publication period
2010
2008
2007
2006

Co-Authors (by relevance)

  • Hueting, Raymond
  • Tiggelman, M. P. J.
  • Reimann, K.
  • Mauczok, R.
  • Keur, W.
  • Liu, J.
  • Schmitz, Jurriaan
  • Furukawa, Y.
  • Beelen, D.
OrganizationsLocationPeople

article

BaxSr1-xTi1.02O3 metal-insulator-metal capacitors on planarized alumina substrates

  • Hueting, Raymond
  • Tiggelman, M. P. J.
  • Reimann, K.
  • Mauczok, R.
  • Klee, M.
  • Keur, W.
Abstract

Nanocrystalline barium strontium titanate (BaxSr1−xTi1.02O3) thin films with a barium content of x=0.8, 0.9 and 1 have been fabricated in a metal–insulator–metal configuration on glass-planarized alumina substrates. Cost-effective processing measures have been utilized by using poly-crystalline alumina substrates, wetchemical processing of the dielectric, and by a small physical area of the ferroelectric capacitors (as low as 50 μm2 for radio frequencies measurements). Glass-planarization on alumina ceramic substrates enables barium strontium titanate films with high quality and homogeneity. We mainly focus on fine-tuning the electrical performance in the low gigahertz range (<10 GHz). Extensive micro-structural and electrical characterization has been performed. Micro-structural information is obtained by: Transmission Electron Microscopy, Scanning Electron Microscopy and X-ray diffraction. The dielectric response is investigated as a function of temperature, frequency and electric field for each sample. We measured a relatively constant permittivity for typical operating temperatures of applications. The quality factor Q is between 21 and 27 at 1 GHz at zero DC bias and the tuning ratio η between 1.8 and 2.2 at |E|=0.4 MV/cm.

Topics
  • impedance spectroscopy
  • scanning electron microscopy
  • x-ray diffraction
  • thin film
  • glass
  • glass
  • Strontium
  • transmission electron microscopy
  • ceramic
  • Barium