People | Locations | Statistics |
---|---|---|
Naji, M. |
| |
Motta, Antonella |
| |
Aletan, Dirar |
| |
Mohamed, Tarek |
| |
Ertürk, Emre |
| |
Taccardi, Nicola |
| |
Kononenko, Denys |
| |
Petrov, R. H. | Madrid |
|
Alshaaer, Mazen | Brussels |
|
Bih, L. |
| |
Casati, R. |
| |
Muller, Hermance |
| |
Kočí, Jan | Prague |
|
Šuljagić, Marija |
| |
Kalteremidou, Kalliopi-Artemi | Brussels |
|
Azam, Siraj |
| |
Ospanova, Alyiya |
| |
Blanpain, Bart |
| |
Ali, M. A. |
| |
Popa, V. |
| |
Rančić, M. |
| |
Ollier, Nadège |
| |
Azevedo, Nuno Monteiro |
| |
Landes, Michael |
| |
Rignanese, Gian-Marco |
|
Went, M. R.
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (3/3 displayed)
- 2007Electron inelastic mean free path in solids as determined by electron Rutherford back-scatteringcitations
- 2007Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscatteringcitations
- 2005Spectral momentum densities of vanadium and vanadium oxide as measured by high energy (e, 2e) spectroscopycitations
Places of action
Organizations | Location | People |
---|
article
Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering
Abstract
<p>We demonstrate that high-energy, high-resolution reflection electron energy loss spectroscopy can provide unique insights into interface formation, especially for the case where an extended interface is formed. By changing the geometry and/or electron energy the electronic structure can be probed over a range of thicknesses (from 10s of Å to more than 1000 Å). At the same time one resolves the elastically scattered electrons into different components, corresponding to scattering of atoms with different mass (so-called 'electron Rutherford backscattering'). Thus these high-energy REELS/elastic scattering experiments obtain information on both the electronic structure and the atomic composition of the overlayer formed.</p>