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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Majchrzycki, Łukasz
Poznań University of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (8/8 displayed)
- 2023Multigenerational Effects of Graphene Oxide Nanoparticles on Acheta domesticus DNA Stabilitycitations
- 2020X-ray photoelectron and resistivity studies of the Pd-covered Ce thin films
- 2020The Rapeseed Oil Based Organofunctional Silane for Stainless Steel Protective Coatingscitations
- 2018Preparation and characterisation of Fe/Ce multilayer
- 2018Preparation and characterization of partially reduced graphene oxide aerogels doped with transition metal ionscitations
- 2017On the temperature dependent electrical resistivity of CNT layers in view of Variable Range Hopping modelscitations
- 2016XPS valence band studies of nanocrystalline Zr[sbnd]Pd alloy thin filmscitations
- 2014Morphology and magnetic properties of Fe<inf>3</inf>O<inf>4</inf>-alginic acid nanocomposites
Places of action
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article
XPS valence band studies of nanocrystalline Zr[sbnd]Pd alloy thin films
Abstract
<p>The Pd[sbnd]Zr alloy thin films were prepared onto oxidised Si(100) substrates in the temperature range of 295 K up to 700 K using computer-controlled UHV magnetron co-sputtering. The chemical composition and the cleanness of all layers were checked in-situ, immediately after deposition, transferring the samples to an UHV (4 × 10<sup>− 11</sup> mbar) analysis chamber equipped with X-ray Photoelectron Spectroscopy (XPS). Structural studies showed that the samples deposited at 295 K are nanocrystalline with average grain size D ~ 5 nm. Thin films deposited at about 700 K are polycrystalline with D ~ 100 nm. XPS results showed that the position of the valence band measured for the polycrystalline ZrPd<sub>2</sub> alloy thin film are in good agreement with ab initio (GGA + U) calculations. On the other hand, the XPS valence bands of the nanocrystalline ZrPd<sub>2</sub> thin films are considerably broader compared to those measured for the polycrystalline samples. The different microstructures observed in polycrystalline and nanocrystalline alloy thin films lead to significant modifications of their electronic structure.</p>