Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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693.932 PEOPLE
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2011Amorphous boron containing silicon carbo-nitrides created by ion sputtering39citations
  • 2010Comparison of Ti-Zr-V nonevaporable getter films deposited using alloy or twisted wire sputter-targets32citations
  • 2006Influence of mechanical properties on the nanoscratch behaviour of hard nanocomposite TiN/Si3N4 coatings on Si87citations
  • 2005Study of nanocrystalline TiN/Si3N4 thin films deposited using a dual ion beam method39citations

Places of action

Chart of shared publication
Ehiasarian, A. P.
1 / 16 shared
Hovsepian, P.
1 / 9 shared
Vishnyakov, Vm
4 / 30 shared
Valizadeh, R.
3 / 5 shared
Malyshev, O. B.
1 / 2 shared
Hannah, A.
1 / 1 shared
Beake, B. D.
1 / 11 shared
Kumashiro, S.
1 / 1 shared
Donnelly, Stephen
1 / 18 shared
Chart of publication period
2011
2010
2006
2005

Co-Authors (by relevance)

  • Ehiasarian, A. P.
  • Hovsepian, P.
  • Vishnyakov, Vm
  • Valizadeh, R.
  • Malyshev, O. B.
  • Hannah, A.
  • Beake, B. D.
  • Kumashiro, S.
  • Donnelly, Stephen
OrganizationsLocationPeople

article

Amorphous boron containing silicon carbo-nitrides created by ion sputtering

  • Colligon, J. S.
  • Ehiasarian, A. P.
  • Hovsepian, P.
  • Vishnyakov, Vm
Abstract

<p>Silicon carbo-nitride films with Boron were deposited onto Silicon, glass and SS304 Stainless Steel substrates using the ion beam assisted deposition (IBAD) method. The coating composition, rate of ion-assistance and substrate temperature were varied. Films were examined by X-Ray Diffraction, Scanning Electron microscopy, Energy Dispersive X-Ray analysis, Cathodoluminescence, Atomic Force Microscopy and Nano-indentation. The composition and chemical bonding variation was found to be dependent on deposition conditions. All coatings were amorphous, fully dense and showed high hardness up to 33GPa. It is suggested that the low friction coefficient of about 0.3, measured against Al<sub>2</sub>O<sub>3</sub> using the pin-on-disc method, may be the result of the presence of C nanoclusters which are formed under the low energy deposition conditions. Films deposited on Stainless Steel had an onset of rapid thermal oxidation at 1150°C in air as determined by thermogravimetric analysis. The films have a Tauc bandgap between 2.2 and 2.8eV and were also exceptionally high electrical resistive which may indicate the presence of localised states.</p>

Topics
  • Deposition
  • impedance spectroscopy
  • amorphous
  • stainless steel
  • scanning electron microscopy
  • x-ray diffraction
  • atomic force microscopy
  • glass
  • glass
  • nitride
  • hardness
  • thermogravimetry
  • Silicon
  • Boron