Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2017Double-negative multilayer containing an extrinsic random layer thickness magnetized cold plasma photonic quantum-well defect28citations

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Aghajamali, Alireza
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Nayak, Chittaranjan
1 / 1 shared
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2017

Co-Authors (by relevance)

  • Aghajamali, Alireza
  • Nayak, Chittaranjan
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article

Double-negative multilayer containing an extrinsic random layer thickness magnetized cold plasma photonic quantum-well defect

  • Aghajamali, Alireza
  • Nayak, Chittaranjan
  • Saha, Ardhendu
Abstract

Theoretically, the transmission properties of a symmetric double-negative metamaterial one-dimensional photonic crystal containing an extrinsic random layer thickness magnetized cold plasma photonic quantum-well defect structure have been investigated. From the numerical results performed by characteristics matrix method, it is found that, such type of structure possesses a transmission peak within the zero-nbar gap. To design a tunable microwave filter, the effects of many parameters such as randomness of layer thickness of the multilayer defect in terms of standard deviation (σ), strength of external magnetic field (B) and electron density of magnetized cold plasma (ne) on transmission peak is discussed. Our findings show that the histogram for the central frequency of the transmission peaks becomes wider with respect to smaller values of σ. In addition, in the case of B, our investigations also reveal that the histogram shifts to the higher frequency range and vice versa while considering the case of ne . These findings help to design a tunable filter for different microwave applications.

Topics
  • density
  • impedance spectroscopy
  • strength
  • defect
  • random
  • metamaterial
  • one-dimensional
  • defect structure