Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (2/2 displayed)

  • 2009Self-assembly of Ge quantum dots on silicon: an example of controlled nanomanufacturing3citations
  • 2008Ordering of Ge quantum dots on silicon surfaces via bottom-up and top-down approachescitations

Places of action

Chart of shared publication
Balzarotti, Adalberto
2 / 18 shared
Fanfoni, Massimo
2 / 12 shared
Sgarlata, Anna
2 / 18 shared
Persichetti, L.
1 / 5 shared
Moro, Dario Del
1 / 1 shared
Chart of publication period
2009
2008

Co-Authors (by relevance)

  • Balzarotti, Adalberto
  • Fanfoni, Massimo
  • Sgarlata, Anna
  • Persichetti, L.
  • Moro, Dario Del
OrganizationsLocationPeople

article

Self-assembly of Ge quantum dots on silicon: an example of controlled nanomanufacturing

  • Balzarotti, Adalberto
  • Fanfoni, Massimo
  • Sgarlata, Anna
  • Persichetti, L.
  • Bernardi, Marco
Abstract

We have grown Ge dots by physical vapor deposition on step bunched Si(111), vicinal Si(100) and oxidized Si(100) surfaces. A control of their one- and two-dimensional ordering was achieved through the combination of top-down patterning techniques (Focused Ion Beam milling) and naturally occurring instabilities. We studied the growth kinetics and self-organization of the islands using Scanning Tunnelling Microscopy in UHV and Atomic Force Microscopy, and we used a software routine to analyze the in-plane ordering of the islands on selected images. We focused on the study of the first nucleation stages of the dots, and attempted to correlate the observed behavior with the properties of high-miscut vicinal Si(100) surfaces. The relevance of this research to quantum-dots based technology is discussed.

Topics
  • impedance spectroscopy
  • surface
  • atomic force microscopy
  • grinding
  • milling
  • physical vapor deposition
  • focused ion beam
  • Silicon
  • two-dimensional
  • quantum dot
  • self-assembly