Materials Map

Discover the materials research landscape. Find experts, partners, networks.

  • About
  • Privacy Policy
  • Legal Notice
  • Contact

The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

×

Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

To Graph

1.080 Topics available

To Map

977 Locations available

693.932 PEOPLE
693.932 People People

693.932 People

Show results for 693.932 people that are selected by your search filters.

←

Page 1 of 27758

→
←

Page 1 of 0

→
PeopleLocationsStatistics
Naji, M.
  • 2
  • 13
  • 3
  • 2025
Motta, Antonella
  • 8
  • 52
  • 159
  • 2025
Aletan, Dirar
  • 1
  • 1
  • 0
  • 2025
Mohamed, Tarek
  • 1
  • 7
  • 2
  • 2025
Ertürk, Emre
  • 2
  • 3
  • 0
  • 2025
Taccardi, Nicola
  • 9
  • 81
  • 75
  • 2025
Kononenko, Denys
  • 1
  • 8
  • 2
  • 2025
Petrov, R. H.Madrid
  • 46
  • 125
  • 1k
  • 2025
Alshaaer, MazenBrussels
  • 17
  • 31
  • 172
  • 2025
Bih, L.
  • 15
  • 44
  • 145
  • 2025
Casati, R.
  • 31
  • 86
  • 661
  • 2025
Muller, Hermance
  • 1
  • 11
  • 0
  • 2025
Kočí, JanPrague
  • 28
  • 34
  • 209
  • 2025
Šuljagić, Marija
  • 10
  • 33
  • 43
  • 2025
Kalteremidou, Kalliopi-ArtemiBrussels
  • 14
  • 22
  • 158
  • 2025
Azam, Siraj
  • 1
  • 3
  • 2
  • 2025
Ospanova, Alyiya
  • 1
  • 6
  • 0
  • 2025
Blanpain, Bart
  • 568
  • 653
  • 13k
  • 2025
Ali, M. A.
  • 7
  • 75
  • 187
  • 2025
Popa, V.
  • 5
  • 12
  • 45
  • 2025
Rančić, M.
  • 2
  • 13
  • 0
  • 2025
Ollier, Nadège
  • 28
  • 75
  • 239
  • 2025
Azevedo, Nuno Monteiro
  • 4
  • 8
  • 25
  • 2025
Landes, Michael
  • 1
  • 9
  • 2
  • 2025
Rignanese, Gian-Marco
  • 15
  • 98
  • 805
  • 2025

Scheul, Tudor

  • Google
  • 4
  • 7
  • 23

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2022Light scattering from black silicon surfaces and its benefits for encapsulated solar cells13citations
  • 2020Optoelectronic properties of ultrathin ALD silicon nitride and its potential as a hole-selective nanolayer for high efficiency solar cells8citations
  • 2019Characterization of atomic layer deposited alumina thin films on black silicon textures using helium ion microscopy2citations
  • 2018Metal-assisted chemically etched black silicon for crystalline silicon solar cellscitations

Places of action

Chart of shared publication
Charlton, Martin
1 / 11 shared
Boden, Stuart
4 / 8 shared
Rahman, Tasmiat
4 / 7 shared
Khorani, Edris
4 / 13 shared
Mcnab, Shona
1 / 4 shared
Wilshaw, Peter
1 / 1 shared
Bonilla, Ruy Sebastian
1 / 2 shared
Chart of publication period
2022
2020
2019
2018

Co-Authors (by relevance)

  • Charlton, Martin
  • Boden, Stuart
  • Rahman, Tasmiat
  • Khorani, Edris
  • Mcnab, Shona
  • Wilshaw, Peter
  • Bonilla, Ruy Sebastian
OrganizationsLocationPeople

article

Light scattering from black silicon surfaces and its benefits for encapsulated solar cells

  • Charlton, Martin
  • Scheul, Tudor
  • Boden, Stuart
  • Rahman, Tasmiat
  • Khorani, Edris
Abstract

Black silicon (b-Si) has been widely investigated as a potential replacement for more traditional antireflective schemes for silicon solar cells, such as random pyramids, due to its reduced broadband reflectance and improved light-trapping properties. Wavelength and angle resolved scattering (WARS) reflectance measurements provide the means of analysing the amount of light scattered from a textured surface, which can be of interest when considering the amount of light trapped through total internal reflectance (TIR) at various interfaces in an encapsulated photovoltaic module. Here we present and analyse results from WARS measurements on b-Si surfaces fabricated using metal assisted chemical etching (MACE). Large angle scattering is observed for the entire spectrum, increasingly so for shorter incident wavelengths and increasing height of texture features. This is predicted to result in 35-40% of the reflected light being trapped by TIR at the glass-air interface and redirected back onto the sample, when the sample is encapsulated in standard PV module materials. This leads to a calculated additional boost of up to 0.45% in the photogenerated current of an encapsulated black silicon solar cell. This exceeds the calculated 0.21% boost due to TIR predicted for an encapsulated solar cell employing the industry-standard random pyramid texture with a thin film antireflective coating.

Topics
  • impedance spectroscopy
  • surface
  • thin film
  • glass
  • glass
  • texture
  • Silicon
  • etching
  • random
  • light scattering